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Quantitative mechanisms behind the synchronous increase of strength and electrical conductivity of cold-drawing oxygen-free Cu wires
Sun, P. F.1; Zhang, P. L.1; Hou, J. P.2; Wang, Q.2; Zhang, Z. F.2
Corresponding AuthorZhang, P. L.(zhangpl@lut.edu.cn) ; Hou, J. P.(jphou@imr.ac.cn) ; Zhang, Z. F.(zhfzhang@imr.ac.cn)
2021-05-15
Source PublicationJOURNAL OF ALLOYS AND COMPOUNDS
ISSN0925-8388
Volume863Pages:9
AbstractHigh strength and high electrical conductivity (EC) are the key performance for Cu wire. However, the trade-off relation between the strength and the electrical conductivity limits the application of high-performance Cu wires. In the study, the simultaneous increase of strength and electrical conductivity was found in the oxygen-free Cu wire (OFCW) manufactured by cold-drawing process. The results show that the dislocation, texture and grain are three main factors influencing the strength and electrical conductivity of the cold-drawing OFCWs. Moreover, the contribution of microstructures to strength and electrical conductivity was calculated quantitatively. Three strengthening mechanisms including dislocation, grain boundary and < 111 > texture strengthening are considered to be the main factors that strengthen the colddrawing OFCWs. Besides, the elongated grains and the dislocation recovery are responsible for the increase of electrical conductivity. Finally, the thin-long grains are revealed to be the key factor leading to the synchronous increase of strength and electrical conductivity. (C) 2021 Elsevier B.V. All rights reserved.
KeywordOxygen-free Cu wire Cold-drawing Strength Electrical conductivity
Funding OrganizationNational Natural Science Foundation of China ; State Grid Corporation of China ; China Postdoctoral Science Foundation ; LiaoNing Revitalization Talents Program
DOI10.1016/j.jallcom.2021.158759
Indexed BySCI
Language英语
Funding ProjectNational Natural Science Foundation of China[52001313] ; State Grid Corporation of China[5211HD190002] ; China Postdoctoral Science Foundation[2019M661151] ; LiaoNing Revitalization Talents Program[XLYC1808027]
WOS Research AreaChemistry ; Materials Science ; Metallurgy & Metallurgical Engineering
WOS SubjectChemistry, Physical ; Materials Science, Multidisciplinary ; Metallurgy & Metallurgical Engineering
WOS IDWOS:000621714200104
PublisherELSEVIER SCIENCE SA
Citation statistics
Cited Times:2[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/161519
Collection中国科学院金属研究所
Corresponding AuthorZhang, P. L.; Hou, J. P.; Zhang, Z. F.
Affiliation1.Lanzhou Univ Technol, State Key Lab Adv Proc & Recycling Nonferrous Met, Lanzhou, Peoples R China
2.Chinese Acad Sci, Fatigue & Fracture Lab Mat, Shi Changxu Innovat Ctr Adv Mat, Inst Met Res, 72 Wenhua Rd, Shenyang 110016, Peoples R China
Recommended Citation
GB/T 7714
Sun, P. F.,Zhang, P. L.,Hou, J. P.,et al. Quantitative mechanisms behind the synchronous increase of strength and electrical conductivity of cold-drawing oxygen-free Cu wires[J]. JOURNAL OF ALLOYS AND COMPOUNDS,2021,863:9.
APA Sun, P. F.,Zhang, P. L.,Hou, J. P.,Wang, Q.,&Zhang, Z. F..(2021).Quantitative mechanisms behind the synchronous increase of strength and electrical conductivity of cold-drawing oxygen-free Cu wires.JOURNAL OF ALLOYS AND COMPOUNDS,863,9.
MLA Sun, P. F.,et al."Quantitative mechanisms behind the synchronous increase of strength and electrical conductivity of cold-drawing oxygen-free Cu wires".JOURNAL OF ALLOYS AND COMPOUNDS 863(2021):9.
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