In-situ investigation of dwell fatigue damage mechanism of pure Ti using digital image correlation technique

doi:10.1016/j.matchar.2021.111466

IMR OpenIR

	In-situ investigation of dwell fatigue damage mechanism of pure Ti using digital image correlation technique
	Zeng, L. R.1; Wang, L. Y.2; Hua, P. T.3; He, Z. P.1; Zhang, G. P.2
通讯作者	Zhang, G. P.(gpzhang@imr.ac.cn)
	2021-11-01
发表期刊	MATERIALS CHARACTERIZATION
ISSN	1044-5803
卷号	181 页码:9
摘要	The damage behavior of soft-hard grain combinations in a pure Ti subjected to pure fatigue and dwell fatigue loading was investigated in-situ using the digital image correlation technique combined with the electron backscattering diffraction technique. The results show that the basal slip of hard grains only occurred under dwell fatigue loading, revealing that the basal slip is strongly time-dependent. The facet formation is mainly attributed to the time-dependent basal slip assisted by the locally high stress. The soft orientation also influenced the deformation degree of the hard grains under pure fatigue loading via the strain incompatibility between the soft and hard grains. These findings have significant implications in further understanding the effect of grain orientation-dependent strain rate sensitivity of the pure Ti on the dwell effect.
关键词	Dwell fatigue Digital image correlation Damage behavior Pure Ti In-situ
资助者	Applied Basic Research Programs of Sichuan province ; Chengdu technology innovation research and development project of Chengdu City ; Fundamental Research Project of Shenyang National Laboratory for Materials Science
DOI	10.1016/j.matchar.2021.111466
收录类别	SCI
语种	英语
资助项目	Applied Basic Research Programs of Sichuan province[2018JY0062] ; Chengdu technology innovation research and development project of Chengdu City[2019-YFYF-00013-SN] ; Fundamental Research Project of Shenyang National Laboratory for Materials Science[L2019R18]
WOS研究方向	Materials Science ; Metallurgy & Metallurgical Engineering
WOS类目	Materials Science, Multidisciplinary ; Metallurgy & Metallurgical Engineering ; Materials Science, Characterization & Testing
WOS记录号	WOS:000706115900005
出版者	ELSEVIER SCIENCE INC
引用统计	被引频次：11[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/166534
专题	中国科学院金属研究所
通讯作者	Zhang, G. P.
作者单位	1.Chengdu Univ, Sch Mech Engn, 2025 Chengluo Rd, Chengdu 610106, Peoples R China 2.Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, 72 Wenhua Rd, Shenyang 110016, Peoples R China 3.Hunan Goldsky Titanium Ind Technol Co LTD, Chongde West Rd, Changde 415001, Peoples R China
推荐引用方式 GB/T 7714	Zeng, L. R.,Wang, L. Y.,Hua, P. T.,et al. In-situ investigation of dwell fatigue damage mechanism of pure Ti using digital image correlation technique[J]. MATERIALS CHARACTERIZATION,2021,181:9.
APA	Zeng, L. R.,Wang, L. Y.,Hua, P. T.,He, Z. P.,&Zhang, G. P..(2021).In-situ investigation of dwell fatigue damage mechanism of pure Ti using digital image correlation technique.MATERIALS CHARACTERIZATION,181,9.
MLA	Zeng, L. R.,et al."In-situ investigation of dwell fatigue damage mechanism of pure Ti using digital image correlation technique".MATERIALS CHARACTERIZATION 181(2021):9.