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Measuring phonon dispersion at an interface
Qi, Ruishi1,2,3; Shi, Ruochen1,2; Li, Yuehui1,2; Sun, Yuanwei1,2; Wu, Mei1,2; Li, Ning1,2,4; Du, Jinlong1; Liu, Kaihui5,6,7; Chen, Chunlin8; Chen, Ji5; Wang, Feng3; Yu, Dapeng1,9; Wang, En-Ge2,10,11; Gao, Peng1,2,6,7,12
Corresponding AuthorGao, Peng(p-gao@pku.edu.cn)
2021-11-18
Source PublicationNATURE
ISSN0028-0836
Volume599Issue:7885Pages:399-+
AbstractFour-dimensional electron energy-loss spectroscopy measurements of the vibrational spectra and the phonon dispersion at a heterointerface show localized modes that are predicted to affect the thermal conductance and electron mobility. The breakdown of translational symmetry at heterointerfaces leads to the emergence of new phonon modes localized at the interface(1). These modes have an essential role in thermal and electrical transport properties in devices, especially in miniature ones wherein the interface may dominate the entire response of the device(2). Although related theoretical work began decades ago(1,3-5), experimental research is totally absent owing to challenges in achieving the combined spatial, momentum and spectral resolutions required to probe localized modes. Here, using the four-dimensional electron energy-loss spectroscopy technique, we directly measure both the local vibrational spectra and the interface phonon dispersion relation for an epitaxial cubic boron nitride/diamond heterointerface. In addition to bulk phonon modes, we observe modes localized at the interface and modes isolated from the interface. These features appear only within approximately one nanometre around the interface. The localized modes observed here are predicted to substantially affect the interface thermal conductance and electron mobility. Our findings provide insights into lattice dynamics at heterointerfaces, and the demonstrated experimental technique should be useful in thermal management, electrical engineering and topological phononics.
DOI10.1038/s41586-021-03971-9
Indexed BySCI
Language英语
WOS Research AreaScience & Technology - Other Topics
WOS SubjectMultidisciplinary Sciences
WOS IDWOS:000720055600019
PublisherNATURE PORTFOLIO
Citation statistics
Cited Times:3[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/167491
Collection中国科学院金属研究所
Corresponding AuthorGao, Peng
Affiliation1.Peking Univ, Sch Phys, Electron Microscopy Lab, Beijing, Peoples R China
2.Peking Univ, Int Ctr Quantum Mat, Beijing, Peoples R China
3.Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA
4.Peking Univ, Acad Adv Interdisciplinary Studies, Beijing, Peoples R China
5.Peking Univ, Sch Phys, State Key Lab Mesoscop Phys, Beijing, Peoples R China
6.Collaborat Innovat Ctr Quantum Matter, Beijing, Peoples R China
7.Peking Univ, Ctr Light Element Adv Mat, Interdisciplinary Inst Light Element Quantum Mat, Beijing, Peoples R China
8.Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang, Peoples R China
9.Southern Univ Sci & Technol, Shenzhen Inst Quantum Sci & Engn SIQSE, Shenzhen, Peoples R China
10.Chinese Acad Sci, Inst Phys, Songshan Lake Mat Lab, Dongguan, Peoples R China
11.Liaoning Univ, Sch Phys, Shenyang, Peoples R China
12.Beijing Graphene Inst, Beijing, Peoples R China
Recommended Citation
GB/T 7714
Qi, Ruishi,Shi, Ruochen,Li, Yuehui,et al. Measuring phonon dispersion at an interface[J]. NATURE,2021,599(7885):399-+.
APA Qi, Ruishi.,Shi, Ruochen.,Li, Yuehui.,Sun, Yuanwei.,Wu, Mei.,...&Gao, Peng.(2021).Measuring phonon dispersion at an interface.NATURE,599(7885),399-+.
MLA Qi, Ruishi,et al."Measuring phonon dispersion at an interface".NATURE 599.7885(2021):399-+.
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