TEM observation of tin whisker

IMR OpenIR

	TEM observation of tin whisker; TEM observation of tin whisker; TEM observation of tin whisker
	M. Liu; A. P. Xian
	2011 ; 2011 ; 2011
发表期刊	Science China-Technological Sciences ; Science China-Technological Sciences ; Science China-Technological Sciences
ISSN	1674-7321 ; 1674-7321 ; 1674-7321
卷号	54 期号:6 页码:1546-1550
摘要	The tin whiskers spontaneously grew from the NdSn(3) intermetallic compound (IMC) after exposure to ambient conditions. One such fine tin whisker with a diameter of about 600 nm was observed by transmission electron microscope (TEM). The results showed the whisker was a perfect beta-Sn single-crystal without dislocations or low angle grain boundaries. The whisker growth axis was calculated as [111]. There were interference fringes in the bright-field image of the tin whisker, which reflected the existence of growth stress in the whisker. A 15-18 nm native tin-oxide film on the tin whisker containing many crystal defects was also found. The new results are helpful in understanding the tin whisker growth mechanism.; The tin whiskers spontaneously grew from the NdSn(3) intermetallic compound (IMC) after exposure to ambient conditions. One such fine tin whisker with a diameter of about 600 nm was observed by transmission electron microscope (TEM). The results showed the whisker was a perfect beta-Sn single-crystal without dislocations or low angle grain boundaries. The whisker growth axis was calculated as [111]. There were interference fringes in the bright-field image of the tin whisker, which reflected the existence of growth stress in the whisker. A 15-18 nm native tin-oxide film on the tin whisker containing many crystal defects was also found. The new results are helpful in understanding the tin whisker growth mechanism.; The tin whiskers spontaneously grew from the NdSn(3) intermetallic compound (IMC) after exposure to ambient conditions. One such fine tin whisker with a diameter of about 600 nm was observed by transmission electron microscope (TEM). The results showed the whisker was a perfect beta-Sn single-crystal without dislocations or low angle grain boundaries. The whisker growth axis was calculated as [111]. There were interference fringes in the bright-field image of the tin whisker, which reflected the existence of growth stress in the whisker. A 15-18 nm native tin-oxide film on the tin whisker containing many crystal defects was also found. The new results are helpful in understanding the tin whisker growth mechanism.
部门归属	[liu meng; xian aiping] chinese acad sci, shenyang natl lab mat sci, inst met res, shenyang 110016, peoples r china.;xian, ap (reprint author), chinese acad sci, shenyang natl lab mat sci, inst met res, shenyang 110016, peoples r china;ap.xian@imr.ac.cn ; [liu meng; xian aiping] chinese acad sci, shenyang natl lab mat sci, inst met res, shenyang 110016, peoples r china.;xian, ap (reprint author), chinese acad sci, shenyang natl lab mat sci, inst met res, shenyang 110016, peoples r china;ap.xian@imr.ac.cn ; [liu meng; xian aiping] chinese acad sci, shenyang natl lab mat sci, inst met res, shenyang 110016, peoples r china.;xian, ap (reprint author), chinese acad sci, shenyang natl lab mat sci, inst met res, shenyang 110016, peoples r china;ap.xian@imr.ac.cn
关键词	Tin Tin Tin Whiskers Whiskers Whiskers Transmission Electron Microscope Transmission Electron Microscope Transmission Electron Microscope Electron-microscopy Electron-microscopy Electron-microscopy Growth Growth Growth
URL	查看原文 ; 查看原文 ; 查看原文
WOS记录号	WOS:000290940000027 ; WOS:000290940000027 ; WOS:000290940000027
引用统计	被引频次：5[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/30539
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	M. Liu,A. P. Xian. TEM observation of tin whisker, TEM observation of tin whisker, TEM observation of tin whisker[J]. Science China-Technological Sciences, Science China-Technological Sciences, Science China-Technological Sciences,2011, 2011, 2011,54, 54, 54(6):1546-1550, 1546-1550, 1546-1550.
APA	M. Liu,&A. P. Xian.(2011).TEM observation of tin whisker.Science China-Technological Sciences,54(6),1546-1550.
MLA	M. Liu,et al."TEM observation of tin whisker".Science China-Technological Sciences 54.6(2011):1546-1550.