Microstructural evolution of PbZr(x)Ti(1-x)O(3)/PbZr(y)Ti(1-y)O(3) (n) epitaxial multilayers (x/y=0.2/0.4, 0.4/0.6) - dependence on layer thickness | |
Y. L. Zhu; S. J. Zheng; X. L. Ma; L. Feigl; M. Alexe; D. Hesse; I. Vrejoiu | |
2010 | |
发表期刊 | Philosophical Magazine
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ISSN | 1478-6435 |
卷号 | 90期号:10页码:1359-1372 |
摘要 | The microstructure of ferroelectric [PbZr(x)Ti(1-x)O(3)/PbZr(y)Ti(1-y)O(3)](n) epitaxial multilayers (x/y 0.2/0.4, 0.4/0.6) deposited on SrRuO(3)-coated SrTiO(3) substrates by pulsed-laser deposition with different layer periodicity and layer thickness was characterized by means of transmission electron microscopy. Electron diffraction and contrast analysis revealed a very clear and well-separated layer sequence. The microstructures of PbZr(0.2)Ti(0.8)O(3)/PbZr(0.4)Ti(0.6)O(3) and PbZr(0.4)Ti(0.6)O(3)/PbZr(0.6)Ti(0.4)O(3) multilayers show a similar tendency in the dependence on the individual layer thickness. Whereas with thick individual layers, tetragonal a-domains are confined to specific layers of the two types of multilayers, below a certain critical thickness of the individual layers, a-domains extend over the whole film. This indicates a transition into a uniform tetragonal lattice and strain state of the whole multilayer. Increasing the layer periodicity further, the interfaces in PbZr(0.4)Ti(0.6)O(3)/PbZr(0.6)Ti(0.4)O(3) multilayers become rough, and complex a-domain configurations appear. |
部门归属 | [zhu, y. l.; zheng, s. j.; ma, x. l.] chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, peoples r china. [feigl, l.; alexe, m.; hesse, d.; vrejoiu, i.] max planck inst microstruct phys, d-06120 halle, germany.;zhu, yl (reprint author), chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, peoples r china;ylzhu@imr.ac.cn |
关键词 | Ferroelectrics Transmission Electron Microscopy Microstructure Ferroelectric Thin-films Misfit Relaxation Mechanisms Domain Configurations Heterostructures Polarization |
URL | 查看原文 |
文献类型 | 期刊论文 |
条目标识符 | http://ir.imr.ac.cn/handle/321006/31802 |
专题 | 中国科学院金属研究所 |
推荐引用方式 GB/T 7714 | Y. L. Zhu,S. J. Zheng,X. L. Ma,et al. Microstructural evolution of PbZr(x)Ti(1-x)O(3)/PbZr(y)Ti(1-y)O(3) (n) epitaxial multilayers (x/y=0.2/0.4, 0.4/0.6) - dependence on layer thickness[J]. Philosophical Magazine,2010,90(10):1359-1372. |
APA | Y. L. Zhu.,S. J. Zheng.,X. L. Ma.,L. Feigl.,M. Alexe.,...&I. Vrejoiu.(2010).Microstructural evolution of PbZr(x)Ti(1-x)O(3)/PbZr(y)Ti(1-y)O(3) (n) epitaxial multilayers (x/y=0.2/0.4, 0.4/0.6) - dependence on layer thickness.Philosophical Magazine,90(10),1359-1372. |
MLA | Y. L. Zhu,et al."Microstructural evolution of PbZr(x)Ti(1-x)O(3)/PbZr(y)Ti(1-y)O(3) (n) epitaxial multilayers (x/y=0.2/0.4, 0.4/0.6) - dependence on layer thickness".Philosophical Magazine 90.10(2010):1359-1372. |
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