| Analysis of microstructure of silicon carbide fiber by Raman spectroscopy; Analysis of microstructure of silicon carbide fiber by Raman spectroscopy | |
| B. H. Jin; N. L. Shi | |
| 2008 ; 2008 | |
| Source Publication | Journal of Materials Science & Technology
 ; Journal of Materials Science & Technology
|
| ISSN | 1005-0302 ; 1005-0302 |
| Volume | 24Issue:2Pages:261-264 |
| Abstract | The SiC fiber was prepared by chemical vapour depostion, which consists of tungsten core, SiC layer and carbon coating. The microstructure of the fiber was investigated using Raman spectroscopy, illustrating SiC variation in different region of the fiber. The result shows that the SiC layer can be subdivided into two parts in the morphologies of SiC grains; their sizes increase and their orientations become order with increasing distance from the fiber center. It is demonstrated that the mount of free carbon in the fiber is responsible for the variation of SiC grains in sizes and morphologies. The analysis of Raman spectra shows that the predominant beta-SiC has extensive stacking faults within the crystallites and mixes other polytypes and amorphous SiC into the structure in the fiber.; The SiC fiber was prepared by chemical vapour depostion, which consists of tungsten core, SiC layer and carbon coating. The microstructure of the fiber was investigated using Raman spectroscopy, illustrating SiC variation in different region of the fiber. The result shows that the SiC layer can be subdivided into two parts in the morphologies of SiC grains; their sizes increase and their orientations become order with increasing distance from the fiber center. It is demonstrated that the mount of free carbon in the fiber is responsible for the variation of SiC grains in sizes and morphologies. The analysis of Raman spectra shows that the predominant beta-SiC has extensive stacking faults within the crystallites and mixes other polytypes and amorphous SiC into the structure in the fiber. |
| description.department | [jin, baohong; shi, nanlin] chinese acad sci, inst met res, shenyang 110016, peoples r china.;shi, nl (reprint author), chinese acad sci, inst met res, shenyang 110016, peoples r china;nlshi@imr.ac.cn ; [jin, baohong; shi, nanlin] chinese acad sci, inst met res, shenyang 110016, peoples r china.;shi, nl (reprint author), chinese acad sci, inst met res, shenyang 110016, peoples r china;nlshi@imr.ac.cn |
| Keyword | Raman Spectra Raman Spectra Optical Phonon Optical Phonon Sic Fiber Sic Fiber Carbon Content Carbon Content Sic Polytypes Sic Polytypes Carbon-films Carbon-films Scattering Scattering Graphite Graphite Spectrum Spectrum |
| URL | 查看原文 ; 查看原文 |
| WOS ID | WOS:000254637200025 ; WOS:000254637200025 |
| Citation statistics | |
| Document Type | 期刊论文 |
| Identifier | http://ir.imr.ac.cn/handle/321006/32849 |
| Collection | 中国科学院金属研究所 |
| Recommended Citation GB/T 7714 | B. H. Jin,N. L. Shi. Analysis of microstructure of silicon carbide fiber by Raman spectroscopy, Analysis of microstructure of silicon carbide fiber by Raman spectroscopy[J]. Journal of Materials Science & Technology, Journal of Materials Science & Technology,2008, 2008,24, 24(2):261-264, 261-264. |
| APA | B. H. Jin,&N. L. Shi.(2008).Analysis of microstructure of silicon carbide fiber by Raman spectroscopy.Journal of Materials Science & Technology,24(2),261-264. |
| MLA | B. H. Jin,et al."Analysis of microstructure of silicon carbide fiber by Raman spectroscopy".Journal of Materials Science & Technology 24.2(2008):261-264. |
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