Analysis of microstructure of silicon carbide fiber by Raman spectroscopy

IMR OpenIR

	Analysis of microstructure of silicon carbide fiber by Raman spectroscopy; Analysis of microstructure of silicon carbide fiber by Raman spectroscopy
	B. H. Jin; N. L. Shi
	2008 ; 2008
发表期刊	Journal of Materials Science & Technology ; Journal of Materials Science & Technology
ISSN	1005-0302 ; 1005-0302
卷号	24 期号:2 页码:261-264
摘要	The SiC fiber was prepared by chemical vapour depostion, which consists of tungsten core, SiC layer and carbon coating. The microstructure of the fiber was investigated using Raman spectroscopy, illustrating SiC variation in different region of the fiber. The result shows that the SiC layer can be subdivided into two parts in the morphologies of SiC grains; their sizes increase and their orientations become order with increasing distance from the fiber center. It is demonstrated that the mount of free carbon in the fiber is responsible for the variation of SiC grains in sizes and morphologies. The analysis of Raman spectra shows that the predominant beta-SiC has extensive stacking faults within the crystallites and mixes other polytypes and amorphous SiC into the structure in the fiber.; The SiC fiber was prepared by chemical vapour depostion, which consists of tungsten core, SiC layer and carbon coating. The microstructure of the fiber was investigated using Raman spectroscopy, illustrating SiC variation in different region of the fiber. The result shows that the SiC layer can be subdivided into two parts in the morphologies of SiC grains; their sizes increase and their orientations become order with increasing distance from the fiber center. It is demonstrated that the mount of free carbon in the fiber is responsible for the variation of SiC grains in sizes and morphologies. The analysis of Raman spectra shows that the predominant beta-SiC has extensive stacking faults within the crystallites and mixes other polytypes and amorphous SiC into the structure in the fiber.
部门归属	[jin, baohong; shi, nanlin] chinese acad sci, inst met res, shenyang 110016, peoples r china.;shi, nl (reprint author), chinese acad sci, inst met res, shenyang 110016, peoples r china;nlshi@imr.ac.cn ; [jin, baohong; shi, nanlin] chinese acad sci, inst met res, shenyang 110016, peoples r china.;shi, nl (reprint author), chinese acad sci, inst met res, shenyang 110016, peoples r china;nlshi@imr.ac.cn
关键词	Raman Spectra Raman Spectra Optical Phonon Optical Phonon Sic Fiber Sic Fiber Carbon Content Carbon Content Sic Polytypes Sic Polytypes Carbon-films Carbon-films Scattering Scattering Graphite Graphite Spectrum Spectrum
URL	查看原文 ; 查看原文
WOS记录号	WOS:000254637200025 ; WOS:000254637200025
引用统计	被引频次：16[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/32849
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	B. H. Jin,N. L. Shi. Analysis of microstructure of silicon carbide fiber by Raman spectroscopy, Analysis of microstructure of silicon carbide fiber by Raman spectroscopy[J]. Journal of Materials Science & Technology, Journal of Materials Science & Technology,2008, 2008,24, 24(2):261-264, 261-264.
APA	B. H. Jin,&N. L. Shi.(2008).Analysis of microstructure of silicon carbide fiber by Raman spectroscopy.Journal of Materials Science & Technology,24(2),261-264.
MLA	B. H. Jin,et al."Analysis of microstructure of silicon carbide fiber by Raman spectroscopy".Journal of Materials Science & Technology 24.2(2008):261-264.