IMR OpenIR
Investigation of subboundaries evolution in superplastically deformed NiAl by positron lifetime
X. H. Du; J. T. Guo; B. D. Zhou; L. Y. Xiong
2003
发表期刊Journal of Materials Science & Technology
ISSN1005-0302
卷号19期号:4页码:373-375
摘要In order to study the subboundaries evolution in superplastically deformed NiAl, the positron lifetime change during superplastic deformation process was measured. It is shown that the superplastic deformation of NiAl has not influence on its (2), the newly recrystallized grain boundaries formed during entire superplastic deformation process belong to the calegory of subboundaries and have not contribution to the superplastic strain.
部门归属chinese acad sci, inst met res, dept superalloys, shenyang 110016, peoples r china. harbin inst technol, sch mat sci & engn, harbin 150001, peoples r china.;guo, jt (reprint author), chinese acad sci, inst met res, dept superalloys, shenyang 110016, peoples r china;jtguo@imr.ac.cn
关键词Nial Positron Lifetime Superplasticity Boundaries
URL查看原文
WOS记录号WOS:000184516200024
引用统计
被引频次:1[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.imr.ac.cn/handle/321006/35820
专题中国科学院金属研究所
推荐引用方式
GB/T 7714
X. H. Du,J. T. Guo,B. D. Zhou,et al. Investigation of subboundaries evolution in superplastically deformed NiAl by positron lifetime[J]. Journal of Materials Science & Technology,2003,19(4):373-375.
APA X. H. Du,J. T. Guo,B. D. Zhou,&L. Y. Xiong.(2003).Investigation of subboundaries evolution in superplastically deformed NiAl by positron lifetime.Journal of Materials Science & Technology,19(4),373-375.
MLA X. H. Du,et al."Investigation of subboundaries evolution in superplastically deformed NiAl by positron lifetime".Journal of Materials Science & Technology 19.4(2003):373-375.
条目包含的文件
条目无相关文件。
个性服务
推荐该条目
保存到收藏夹
查看访问统计
导出为Endnote文件
谷歌学术
谷歌学术中相似的文章
[X. H. Du]的文章
[J. T. Guo]的文章
[B. D. Zhou]的文章
百度学术
百度学术中相似的文章
[X. H. Du]的文章
[J. T. Guo]的文章
[B. D. Zhou]的文章
必应学术
必应学术中相似的文章
[X. H. Du]的文章
[J. T. Guo]的文章
[B. D. Zhou]的文章
相关权益政策
暂无数据
收藏/分享
所有评论 (0)
暂无评论
 

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。