IMR OpenIR
Microstructures in advanced materials characterized by HREM and nanoscale analysis
D. X. Li; J. C. Rao; Z. X. Zhou; H. Y. Peng; J. Z. Lan
2000
Source PublicationMaterials Characterization
ISSN1044-5803
Volume44Issue:4-5Pages:391-402
AbstractSegregation of yttrium induces the formation of Y0.25Zr0.75O2-x and Y0.5Zr0.5O2-y microdomains, with L1(2)- and L1(0)-like ordered structures, in ZrO2-6mol%Y2O3 ceramics in both the sintered and annealed states. The compositions of precipitates such as (chi L), (chi S), (chi SS), and small precipitates formed inside XL, in Cu-11.88Al-5.06Ni-1.63Mn-0.96Ti (wt.%) shape memory alloys have been determined. Under electron beam irradiation, four types of dynamic behavior of the G.P. zones were observed in the Al-6.58Zn-2.33Mg-2.40Cu (wt.%) alloy. The G.P. zone and "G.P. zone-like" defect structures were also distinguished. Lattice distortion profile in the GaAs/InxGa1-xAs superlattice and two-dimensional lattice distortion around a 60 degrees dislocation core in the InAs(x)P(1-)x/InP superlattice were determined. (C) Elsevier Science Inc., 2000. All rights reserved.
description.departmentchinese acad sci, inst met res, atom imaging solids lab, shenyang 110015, peoples r china.;li, dx (reprint author), chinese acad sci, inst met res, atom imaging solids lab, 72 wenhua rd, shenyang 110015, peoples r china
KeywordShape-memory Alloys Zirconia Phase Ti Diffraction Crystal
URL查看原文
WOS IDWOS:000089285500007
Citation statistics
Cited Times:1[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/37086
Collection中国科学院金属研究所
Recommended Citation
GB/T 7714
D. X. Li,J. C. Rao,Z. X. Zhou,et al. Microstructures in advanced materials characterized by HREM and nanoscale analysis[J]. Materials Characterization,2000,44(4-5):391-402.
APA D. X. Li,J. C. Rao,Z. X. Zhou,H. Y. Peng,&J. Z. Lan.(2000).Microstructures in advanced materials characterized by HREM and nanoscale analysis.Materials Characterization,44(4-5),391-402.
MLA D. X. Li,et al."Microstructures in advanced materials characterized by HREM and nanoscale analysis".Materials Characterization 44.4-5(2000):391-402.
Files in This Item:
There are no files associated with this item.
Related Services
Recommend this item
Bookmark
Usage statistics
Export to Endnote
Google Scholar
Similar articles in Google Scholar
[D. X. Li]'s Articles
[J. C. Rao]'s Articles
[Z. X. Zhou]'s Articles
Baidu academic
Similar articles in Baidu academic
[D. X. Li]'s Articles
[J. C. Rao]'s Articles
[Z. X. Zhou]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[D. X. Li]'s Articles
[J. C. Rao]'s Articles
[Z. X. Zhou]'s Articles
Terms of Use
No data!
Social Bookmark/Share
All comments (0)
No comment.
 

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.