Microstructures in advanced materials characterized by HREM and nanoscale analysis

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	Microstructures in advanced materials characterized by HREM and nanoscale analysis
	D. X. Li; J. C. Rao; Z. X. Zhou; H. Y. Peng; J. Z. Lan
	2000
发表期刊	Materials Characterization
ISSN	1044-5803
卷号	44 期号:4-5 页码:391-402
摘要	Segregation of yttrium induces the formation of Y0.25Zr0.75O2-x and Y0.5Zr0.5O2-y microdomains, with L1(2)- and L1(0)-like ordered structures, in ZrO2-6mol%Y2O3 ceramics in both the sintered and annealed states. The compositions of precipitates such as (chi L), (chi S), (chi SS), and small precipitates formed inside XL, in Cu-11.88Al-5.06Ni-1.63Mn-0.96Ti (wt.%) shape memory alloys have been determined. Under electron beam irradiation, four types of dynamic behavior of the G.P. zones were observed in the Al-6.58Zn-2.33Mg-2.40Cu (wt.%) alloy. The G.P. zone and "G.P. zone-like" defect structures were also distinguished. Lattice distortion profile in the GaAs/InxGa1-xAs superlattice and two-dimensional lattice distortion around a 60 degrees dislocation core in the InAs(x)P(1-)x/InP superlattice were determined. (C) Elsevier Science Inc., 2000. All rights reserved.
部门归属	chinese acad sci, inst met res, atom imaging solids lab, shenyang 110015, peoples r china.;li, dx (reprint author), chinese acad sci, inst met res, atom imaging solids lab, 72 wenhua rd, shenyang 110015, peoples r china
关键词	Shape-memory Alloys Zirconia Phase Ti Diffraction Crystal
URL	查看原文
WOS记录号	WOS:000089285500007
引用统计	被引频次：1[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/37086
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	D. X. Li,J. C. Rao,Z. X. Zhou,et al. Microstructures in advanced materials characterized by HREM and nanoscale analysis[J]. Materials Characterization,2000,44(4-5):391-402.
APA	D. X. Li,J. C. Rao,Z. X. Zhou,H. Y. Peng,&J. Z. Lan.(2000).Microstructures in advanced materials characterized by HREM and nanoscale analysis.Materials Characterization,44(4-5),391-402.
MLA	D. X. Li,et al."Microstructures in advanced materials characterized by HREM and nanoscale analysis".Materials Characterization 44.4-5(2000):391-402.