The coherent electron microdiffraction of a single translation domain boundary in beta-Ni3Nb phase

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	The coherent electron microdiffraction of a single translation domain boundary in beta-Ni3Nb phase
	H. Y. Pan; K. Du; Y. M. Wang; J. Zhu; S. Y. Li; H. Q. Ye
	1999
发表期刊	Journal of Applied Crystallography
ISSN	0021-8898
卷号	32 页码:951-955
摘要	The microdiffraction from a single translation domain boundary (TDB) in beta-Ni3Nb has been recorded by using a Hitachi HF-2000 field emission gun transmission electron microscope, while high-resolution transmission electron microscopy images were used to assist the analysis. The diffraction splitting effect of a TDB is well explained by the kinematics and dynamic calculations, and complex diffraction characteristics have been studied by using dynamics simulation.
部门归属	tsinghua univ, sch mat sci & engn, electron microscopy lab, beijing 100084, peoples r china. chinese acad sci, inst met res, atom imaging solids lab, shenyang 110015, peoples r china. cent iron & steel res inst, beijing 100081, peoples r china.;pan, hy (reprint author), tsinghua univ, sch mat sci & engn, electron microscopy lab, beijing 100084, peoples r china
关键词	Micro-diffraction Simulation Crystals Images
URL	查看原文
WOS记录号	WOS:000083154800016
引用统计
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/37463
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	H. Y. Pan,K. Du,Y. M. Wang,et al. The coherent electron microdiffraction of a single translation domain boundary in beta-Ni3Nb phase[J]. Journal of Applied Crystallography,1999,32:951-955.
APA	H. Y. Pan,K. Du,Y. M. Wang,J. Zhu,S. Y. Li,&H. Q. Ye.(1999).The coherent electron microdiffraction of a single translation domain boundary in beta-Ni3Nb phase.Journal of Applied Crystallography,32,951-955.
MLA	H. Y. Pan,et al."The coherent electron microdiffraction of a single translation domain boundary in beta-Ni3Nb phase".Journal of Applied Crystallography 32(1999):951-955.