Applications of microdiffraction related to HREM

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	Applications of microdiffraction related to HREM
	J. Zhu; X. F. Duan; D. X. Li; H. Q. Ye
	1998
发表期刊	Microscopy Research and Technique
ISSN	1059-910X
卷号	40 期号:2 页码:122-135
摘要	This paper deals with the coherent and the incoherent microdiffraction, as well as their applications, for example, determination of the nature of defects and boundaries, measurement of the strain field and identification of the symmetry, etc. The localized structure information obtained from microdiffraction has been compared with and complements that provided by HREM. (C) 1998 Wiley-Liss, Inc.
部门归属	tsing hua univ, sch mat sci & engn, beijing 100084, peoples r china. chinese acad sci, beijing lab electron microscopy, beijing 100080, peoples r china. acad sinica, inst met res, atom imaging solids lab, shenyang 110015, peoples r china.;zhu, j (reprint author), tsing hua univ, sch mat sci & engn, beijing 100084, peoples r china
关键词	Coherence Of Source Domain Boundary Stacking Fault Interference Fringe Strain Field Beam Electron-diffraction Strained-layer Superlattices Antiphase Domain Boundaries Elastic Relaxation Micro-diffraction Crystals Dislocations Distortions Specimens Phase
URL	查看原文
WOS记录号	WOS:000071748600004
引用统计	被引频次：3[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/37927
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	J. Zhu,X. F. Duan,D. X. Li,et al. Applications of microdiffraction related to HREM[J]. Microscopy Research and Technique,1998,40(2):122-135.
APA	J. Zhu,X. F. Duan,D. X. Li,&H. Q. Ye.(1998).Applications of microdiffraction related to HREM.Microscopy Research and Technique,40(2),122-135.
MLA	J. Zhu,et al."Applications of microdiffraction related to HREM".Microscopy Research and Technique 40.2(1998):122-135.