The X-ray diffraction study on a nanocrystalline Cu processed by equal-channel angular pressing

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	The X-ray diffraction study on a nanocrystalline Cu processed by equal-channel angular pressing
	K. Zhang; I. V. Alexandrov; K. Lu
	1997
发表期刊	Nanostructured Materials
ISSN	0965-9773
卷号	9 期号:1-8 页码:347-350
摘要	The precise X-ray diffraction structural study of a nanocrystalline Cu sample processed by severe plastic deformation was carried out. The obtained results were compared with the data fi om an initial reference Cu sample. By analysis of the centroid position, broadening, shape of Bragg reflections and background integrated intensities from these two samples, such structural features as a lattice parameter, crystallite size, r.m.s. microstrain, dislocation density Debye-Waller parameter and atomic displacements were determined. A conclusion concerning the specific defect structure in the nanocrystallite Cu sample was drawn. (C) 1997 Acta Metallurgica Inc.
部门归属	ufa state aviat tech univ,inst phys adv mat,ufa 450000,russia.;zhang, k (reprint author), acad sinica,inst met res,state key lab rsa,shenyang 110015,peoples r china
关键词	Crystalline
URL	查看原文
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/38205
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	K. Zhang,I. V. Alexandrov,K. Lu. The X-ray diffraction study on a nanocrystalline Cu processed by equal-channel angular pressing[J]. Nanostructured Materials,1997,9(1-8):347-350.
APA	K. Zhang,I. V. Alexandrov,&K. Lu.(1997).The X-ray diffraction study on a nanocrystalline Cu processed by equal-channel angular pressing.Nanostructured Materials,9(1-8),347-350.
MLA	K. Zhang,et al."The X-ray diffraction study on a nanocrystalline Cu processed by equal-channel angular pressing".Nanostructured Materials 9.1-8(1997):347-350.