Effect of Energy Density on Microstructure and Properties of Al2O3 Plasma Electrolysis Oxidation Film | |
X. H. Guo; K. Q. Du; Q. Z. Guo; Y. Wang; F. H. Wang | |
2013 | |
Source Publication | Ecs Solid State Letters
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ISSN | 2162-8742 |
Volume | 2Issue:7Pages:S1-S4 |
Abstract | The effect of exported energy density on the plasma electrolysis oxidation (PEO) process was studied under transient self-feedback control (TSFC) mode. Properties of the Al2O3 PEO films were characterized by scanning electron microscopy (SEM), Vickers hardness test and electrochemical impedance spectroscopy (EIS). Experimental results indicated that a hard and compact PEO film was obtained at a correct energy density due to the uniform action of the high-frequency square voltage waveform (HFSVW). On the contrary, the high energy density greatly weakened the uniform action of the HFSVW which resulted in large pores and microcracks in the PEO films. (C) 2013 The Electrochemical Society. [DOI: 10.1149/2.006307ssl] All rights reserved. |
description.department | [guo, xinghua ; du, keqin ; guo, quanzhong ; wang, yong ; wang, fuhui] chinese acad sci, inst met res, state key lab corros & protect, shenyang 110016, peoples r china. ; guo, xh (reprint author), chinese acad sci, inst met res, state key lab corros & protect, shenyang 110016, peoples r china. ; kqdu@imr.ac.cn |
Keyword | Porous-electrodes |
URL | 查看原文 |
Language | 英语 |
Document Type | 期刊论文 |
Identifier | http://ir.imr.ac.cn/handle/321006/71236 |
Collection | 中国科学院金属研究所 |
Recommended Citation GB/T 7714 | X. H. Guo,K. Q. Du,Q. Z. Guo,et al. Effect of Energy Density on Microstructure and Properties of Al2O3 Plasma Electrolysis Oxidation Film[J]. Ecs Solid State Letters,2013,2(7):S1-S4. |
APA | X. H. Guo,K. Q. Du,Q. Z. Guo,Y. Wang,&F. H. Wang.(2013).Effect of Energy Density on Microstructure and Properties of Al2O3 Plasma Electrolysis Oxidation Film.Ecs Solid State Letters,2(7),S1-S4. |
MLA | X. H. Guo,et al."Effect of Energy Density on Microstructure and Properties of Al2O3 Plasma Electrolysis Oxidation Film".Ecs Solid State Letters 2.7(2013):S1-S4. |
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