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Length scale effect on the deformation microstructures of grown-in twins in copper
Q. H. Lu; M. L. Sui; X. X. Huang; D. X. Li; N. Hansen
2014
Source PublicationPhilosophical Magazine
ISSN1478-6435
Volume94Issue:20Pages:2262-2280
AbstractElectrodeposited copper samples composed of columnar grains subdivided by alternating twin/matrix (T/M) lamellae have been cold rolled to 30-85% reduction in thickness. The thickness of the T/M lamellae varies over a wide range from a few nanometres to about 1 m. The deformation microstructure has been characterized systematically. In thin T/M lamellae (below 50-100 nm) the deformation behaviours differ significantly from that of thick T/M lamellae, as the dislocation activity is concentrated at the T/M boundaries illustrated by the observations of stacking faults and Shockley partial dislocations. In thick T/M lamellae (100-1000 nm), the deformation microstructure is related to the grain orientation as also observed previously in deformed single crystals and polycrystals with a grain size at the micrometre scale. The experiment therefore suggests that the universal structural characteristics of deformation microstructure can be extended one order of magnitude from about 5 m to the sub-micrometre scale (about 0.5 mu m).
description.department[lu, qiuhong ; li, douxing] chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, peoples r china. [sui, manling] beijing univ technol, inst microstruct & property adv mat, beijing 100124, peoples r china. [huang, xiaoxu ; hansen, niels] tech univ denmark, dept wind energy, sect mat sci & adv characterizat, dk-4000 roskilde, denmark. ; lu, qh (reprint author), chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, peoples r china. ; qhlu@imr.ac.cn ; mlsui@bjut.edu.cn
KeywordDislocation Structures Nanoscale Tem Twin Thickness Crystal Orientation Grain-orientation Dependence Dislocation-structures Ultrahigh Strength Lattice Rotations Maximum Strength Deformed Metals Single-crystals Flow-stress Part Ii Aluminum
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Language英语
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/73327
Collection中国科学院金属研究所
Recommended Citation
GB/T 7714
Q. H. Lu,M. L. Sui,X. X. Huang,et al. Length scale effect on the deformation microstructures of grown-in twins in copper[J]. Philosophical Magazine,2014,94(20):2262-2280.
APA Q. H. Lu,M. L. Sui,X. X. Huang,D. X. Li,&N. Hansen.(2014).Length scale effect on the deformation microstructures of grown-in twins in copper.Philosophical Magazine,94(20),2262-2280.
MLA Q. H. Lu,et al."Length scale effect on the deformation microstructures of grown-in twins in copper".Philosophical Magazine 94.20(2014):2262-2280.
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