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Atomic mapping of structural distortions in 109 degrees domain patterned BiFeO3 thin films
Wang, Wen-Yuan; Zhu, Yin-Lian; Tang, Yun-Long; Han, Meng-Jiao; Wang, Yu-Jia; Ma, Xiu-Liang; Ma, XL (reprint author), Chinese Acad Sci, Shenyang Natl Lab Mat Sci, Inst Met Res, Shenyang 110016, Peoples R China.; Ma, XL (reprint author), Lanzhou Univ Technol, Sch Mat Sci & Engn, Lanzhou 730050, Peoples R China.
2017-06-01
Source PublicationJOURNAL OF MATERIALS RESEARCH
ISSN0884-2914
Volume32Issue:12Pages:2423-2430
AbstractStructural distortions at the nanoscale are delicately linked with many exotic properties for ferroic thin films. Based on advanced aberration corrected scanning transmission electron microscopy, we observe BiFeO3 thin films with variant tensile strain states and demonstrate at an atomic scale the interplay of intrinsic spontaneous structural distortions with external constraints. Structural parameters (the rhombohedral distortion and domain wall shear distortion) under zero (BiFeO3/GdScO3) and 1.5% (BiFeO3/PrScO3) lateral strain states are quantitatively analyzed which are suppressed within a few unit cells near the film/substrate interfaces. In particular, an interfacial layer with asymmetrical lattice distortions (enhanced and reduced out-of-plane lattice spacing) on the two sides of 109 degrees domain wall is resolved. These structural distortions near the film/substrate interface in ferroic thin films reveal intense tanglement of intrinsic distortions of BiFeO3 with external boundary conditions, which could provide new insights for the development of nanoscale ferroelectric devices.; Structural distortions at the nanoscale are delicately linked with many exotic properties for ferroic thin films. Based on advanced aberration corrected scanning transmission electron microscopy, we observe BiFeO3 thin films with variant tensile strain states and demonstrate at an atomic scale the interplay of intrinsic spontaneous structural distortions with external constraints. Structural parameters (the rhombohedral distortion and domain wall shear distortion) under zero (BiFeO3/GdScO3) and 1.5% (BiFeO3/PrScO3) lateral strain states are quantitatively analyzed which are suppressed within a few unit cells near the film/substrate interfaces. In particular, an interfacial layer with asymmetrical lattice distortions (enhanced and reduced out-of-plane lattice spacing) on the two sides of 109 degrees domain wall is resolved. These structural distortions near the film/substrate interface in ferroic thin films reveal intense tanglement of intrinsic distortions of BiFeO3 with external boundary conditions, which could provide new insights for the development of nanoscale ferroelectric devices.
description.department[wang, wen-yuan ; zhu, yin-lian ; tang, yun-long ; han, meng-jiao ; wang, yu-jia ; ma, xiu-liang] chinese acad sci, shenyang natl lab mat sci, inst met res, shenyang 110016, peoples r china ; [wang, wen-yuan] sci & technol surface phys & chem lab, jiangyou 621908, sichuan, peoples r china ; [ma, xiu-liang] lanzhou univ technol, sch mat sci & engn, lanzhou 730050, peoples r china
Subject AreaMaterials Science, Multidisciplinary
Funding OrganizationNational Natural Science Foundation of China [51231007, 51571197, 51501194, 51671194, 51521091]; National Basic Research Program of China [2014CB921002]; Key Research Program of Frontier Sciences, CAS [QYZDJ-SSW-JSC010]
Indexed BySCI
Language英语
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/78099
Collection中国科学院金属研究所
Corresponding AuthorMa, XL (reprint author), Chinese Acad Sci, Shenyang Natl Lab Mat Sci, Inst Met Res, Shenyang 110016, Peoples R China.; Ma, XL (reprint author), Lanzhou Univ Technol, Sch Mat Sci & Engn, Lanzhou 730050, Peoples R China.
Recommended Citation
GB/T 7714
Wang, Wen-Yuan,Zhu, Yin-Lian,Tang, Yun-Long,et al. Atomic mapping of structural distortions in 109 degrees domain patterned BiFeO3 thin films[J]. JOURNAL OF MATERIALS RESEARCH,2017,32(12):2423-2430.
APA Wang, Wen-Yuan.,Zhu, Yin-Lian.,Tang, Yun-Long.,Han, Meng-Jiao.,Wang, Yu-Jia.,...&Ma, XL .(2017).Atomic mapping of structural distortions in 109 degrees domain patterned BiFeO3 thin films.JOURNAL OF MATERIALS RESEARCH,32(12),2423-2430.
MLA Wang, Wen-Yuan,et al."Atomic mapping of structural distortions in 109 degrees domain patterned BiFeO3 thin films".JOURNAL OF MATERIALS RESEARCH 32.12(2017):2423-2430.
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