Atomic mapping of structural distortions in 109 degrees domain patterned BiFeO3 thin films

IMR OpenIR

	Atomic mapping of structural distortions in 109 degrees domain patterned BiFeO3 thin films
	Wang, Wen-Yuan; Zhu, Yin-Lian; Tang, Yun-Long; Han, Meng-Jiao; Wang, Yu-Jia; Ma, Xiu-Liang; Ma, XL (reprint author), Chinese Acad Sci, Shenyang Natl Lab Mat Sci, Inst Met Res, Shenyang 110016, Peoples R China.; Ma, XL (reprint author), Lanzhou Univ Technol, Sch Mat Sci & Engn, Lanzhou 730050, Peoples R China.
	2017-06-01
发表期刊	JOURNAL OF MATERIALS RESEARCH
ISSN	0884-2914
卷号	32 期号:12 页码:2423-2430
摘要	Structural distortions at the nanoscale are delicately linked with many exotic properties for ferroic thin films. Based on advanced aberration corrected scanning transmission electron microscopy, we observe BiFeO3 thin films with variant tensile strain states and demonstrate at an atomic scale the interplay of intrinsic spontaneous structural distortions with external constraints. Structural parameters (the rhombohedral distortion and domain wall shear distortion) under zero (BiFeO3/GdScO3) and 1.5% (BiFeO3/PrScO3) lateral strain states are quantitatively analyzed which are suppressed within a few unit cells near the film/substrate interfaces. In particular, an interfacial layer with asymmetrical lattice distortions (enhanced and reduced out-of-plane lattice spacing) on the two sides of 109 degrees domain wall is resolved. These structural distortions near the film/substrate interface in ferroic thin films reveal intense tanglement of intrinsic distortions of BiFeO3 with external boundary conditions, which could provide new insights for the development of nanoscale ferroelectric devices.; Structural distortions at the nanoscale are delicately linked with many exotic properties for ferroic thin films. Based on advanced aberration corrected scanning transmission electron microscopy, we observe BiFeO3 thin films with variant tensile strain states and demonstrate at an atomic scale the interplay of intrinsic spontaneous structural distortions with external constraints. Structural parameters (the rhombohedral distortion and domain wall shear distortion) under zero (BiFeO3/GdScO3) and 1.5% (BiFeO3/PrScO3) lateral strain states are quantitatively analyzed which are suppressed within a few unit cells near the film/substrate interfaces. In particular, an interfacial layer with asymmetrical lattice distortions (enhanced and reduced out-of-plane lattice spacing) on the two sides of 109 degrees domain wall is resolved. These structural distortions near the film/substrate interface in ferroic thin films reveal intense tanglement of intrinsic distortions of BiFeO3 with external boundary conditions, which could provide new insights for the development of nanoscale ferroelectric devices.
部门归属	[wang, wen-yuan ; zhu, yin-lian ; tang, yun-long ; han, meng-jiao ; wang, yu-jia ; ma, xiu-liang] chinese acad sci, shenyang natl lab mat sci, inst met res, shenyang 110016, peoples r china ; [wang, wen-yuan] sci & technol surface phys & chem lab, jiangyou 621908, sichuan, peoples r china ; [ma, xiu-liang] lanzhou univ technol, sch mat sci & engn, lanzhou 730050, peoples r china
学科领域	Materials Science, Multidisciplinary
资助者	National Natural Science Foundation of China [51231007, 51571197, 51501194, 51671194, 51521091]; National Basic Research Program of China [2014CB921002]; Key Research Program of Frontier Sciences, CAS [QYZDJ-SSW-JSC010]
收录类别	SCI
语种	英语
WOS记录号	WOS:000404965300023
引用统计	被引频次：8[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/78099
专题	中国科学院金属研究所
通讯作者	Ma, XL (reprint author), Chinese Acad Sci, Shenyang Natl Lab Mat Sci, Inst Met Res, Shenyang 110016, Peoples R China.; Ma, XL (reprint author), Lanzhou Univ Technol, Sch Mat Sci & Engn, Lanzhou 730050, Peoples R China.
推荐引用方式 GB/T 7714	Wang, Wen-Yuan,Zhu, Yin-Lian,Tang, Yun-Long,et al. Atomic mapping of structural distortions in 109 degrees domain patterned BiFeO3 thin films[J]. JOURNAL OF MATERIALS RESEARCH,2017,32(12):2423-2430.
APA	Wang, Wen-Yuan.,Zhu, Yin-Lian.,Tang, Yun-Long.,Han, Meng-Jiao.,Wang, Yu-Jia.,...&Ma, XL .(2017).Atomic mapping of structural distortions in 109 degrees domain patterned BiFeO3 thin films.JOURNAL OF MATERIALS RESEARCH,32(12),2423-2430.
MLA	Wang, Wen-Yuan,et al."Atomic mapping of structural distortions in 109 degrees domain patterned BiFeO3 thin films".JOURNAL OF MATERIALS RESEARCH 32.12(2017):2423-2430.