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Gate-controlled reversible rectifying behaviour in tunnel contacted atomically-thin MoS2 transistor
Li, Xiao-Xi; Fan, Zhi-Qiang; Liu, Pei-Zhi; Chen, Mao-Lin; Liu, Xin; Jia, Chuan-Kun; Sun, Dong-Ming; Jiang, Xiang-Wei; Han, Zheng; Bouchiat, Vincent; Guo, Jun-Jie; Chen, Jian-Hao; Zhang, Zhi-Dong; Sun, DM; Han, Z (reprint author), Chinese Acad Sci, Shenyang Natl Lab Mat Sci, Inst Met Res, Shenyang 110016, Liaoning, Peoples R China.; Han, Z (reprint author), Univ Sci & Technol China, Sch Mat Sci & Engn, Hefei 230026, Anhui, Peoples R China.; Jiang, XW (reprint author), Chinese Acad Sci, Inst Semicond, State Key Lab Superlattices & Microstruct, Beijing 100083, Peoples R China.
2017-10-17
发表期刊NATURE PUBLISHING GROUP
ISSN2041-1723
卷号8页码:-
摘要Atomically thin two-dimensional semiconducting materials integrated into van der Waals heterostructures have enabled architectures that hold great promise for next generation nanoelectronics. However, challenges still remain to enable their applications as compliant materials for integration in logic devices. Here, we devise a reverted stacking technique to intercalate a wrinkle-free boron nitride tunnel layer between MoS2 channel and source drain electrodes. Vertical tunnelling of electrons therefore makes it possible to suppress the Schottky barriers and Fermi level pinning, leading to homogeneous gate-control of the channel chemical potential across the bandgap edges. The observed features of ambipolar pn to np diode, which can be reversibly gate tuned, paves the way for future logic applications and high performance switches based on atomically thin semiconducting channel.; Atomically thin two-dimensional semiconducting materials integrated into van der Waals heterostructures have enabled architectures that hold great promise for next generation nanoelectronics. However, challenges still remain to enable their applications as compliant materials for integration in logic devices. Here, we devise a reverted stacking technique to intercalate a wrinkle-free boron nitride tunnel layer between MoS2 channel and source drain electrodes. Vertical tunnelling of electrons therefore makes it possible to suppress the Schottky barriers and Fermi level pinning, leading to homogeneous gate-control of the channel chemical potential across the bandgap edges. The observed features of ambipolar pn to np diode, which can be reversibly gate tuned, paves the way for future logic applications and high performance switches based on atomically thin semiconducting channel.
部门归属[li, xiao-xi ; chen, mao-lin ; sun, dong-ming ; han, zheng ; zhang, zhi-dong] chinese acad sci, shenyang natl lab mat sci, inst met res, shenyang 110016, liaoning, peoples r china ; [li, xiao-xi ; chen, mao-lin ; sun, dong-ming ; han, zheng ; zhang, zhi-dong] univ sci & technol china, sch mat sci & engn, hefei 230026, anhui, peoples r china ; [fan, zhi-qiang ; jiang, xiang-wei] chinese acad sci, inst semicond, state key lab superlattices & microstruct, beijing 100083, peoples r china ; [liu, pei-zhi ; guo, jun-jie] taiyuan univ technol, minist educ, key lab interface sci & engn adv mat, taiyuan 030024, shanxi, peoples r china ; [liu, xin ; chen, jian-hao] peking univ, sch phys, int ctr quantum mat, beijing 100871, peoples r china ; [liu, xin ; chen, jian-hao] collaborat innovat ctr quantum matter, beijing 100871, peoples r china ; [jia, chuan-kun] changsha univ sci & technol, coll mat sci & engn, changsha 410114, hunan, peoples r china ; [bouchiat, vincent] univ grenoble alpes, cnrs, inst neel, f-38000 grenoble, france
学科领域Multidisciplinary Sciences
资助者National Key R&D Program of China [2017YFA0206302]; National Basic Research Program of China (973 Grant) [2013CB921900, 2014CB920900]; National Natural Science Foundation of China (NSFC) [11504385, 51627801]; NSFC [11574304, 51272256, 61422406, 61574143, 11374021, 11774010, 51331006]; Chinese Academy of Sciences-Peking University Pioneer Cooperation Team (CAS-PKU Pioneer Cooperation Team); Youth Innovation Promotion Association CAS [2016109]; MSTC grant [2016YFB04001100]; CAS [KJZD-EW-M05-3]; EU FP7 Graphene Flagship [604391]; J2D project grant from Agence Nationale de la Recherche (ANR) [ANR-15-CE24-0017]; Hsun Lee Award program of the Institute of Metal Research, CAS
收录类别SCI
语种英语
WOS记录号WOS:000413117400004
引用统计
被引频次:63[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.imr.ac.cn/handle/321006/79040
专题中国科学院金属研究所
通讯作者Sun, DM; Han, Z (reprint author), Chinese Acad Sci, Shenyang Natl Lab Mat Sci, Inst Met Res, Shenyang 110016, Liaoning, Peoples R China.; Han, Z (reprint author), Univ Sci & Technol China, Sch Mat Sci & Engn, Hefei 230026, Anhui, Peoples R China.; Jiang, XW (reprint author), Chinese Acad Sci, Inst Semicond, State Key Lab Superlattices & Microstruct, Beijing 100083, Peoples R China.
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GB/T 7714
Li, Xiao-Xi,Fan, Zhi-Qiang,Liu, Pei-Zhi,et al. Gate-controlled reversible rectifying behaviour in tunnel contacted atomically-thin MoS2 transistor[J]. NATURE PUBLISHING GROUP,2017,8:-.
APA Li, Xiao-Xi.,Fan, Zhi-Qiang.,Liu, Pei-Zhi.,Chen, Mao-Lin.,Liu, Xin.,...&Jiang, XW .(2017).Gate-controlled reversible rectifying behaviour in tunnel contacted atomically-thin MoS2 transistor.NATURE PUBLISHING GROUP,8,-.
MLA Li, Xiao-Xi,et al."Gate-controlled reversible rectifying behaviour in tunnel contacted atomically-thin MoS2 transistor".NATURE PUBLISHING GROUP 8(2017):-.
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