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A novel evaluation strategy for fatigue reliability of flexible nanoscale films
Zheng, SX; Luo, XM; Wang, D; Zhang, GP; Zhang, GP (reprint author), Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci SYNL, 72 Wenhua Rd, Shenyang 110016, Liaoning, Peoples R China.
2018-03-01
发表期刊MATERIALS RESEARCH EXPRESS
ISSN2053-1591
卷号5期号:3页码:-
摘要In order to evaluate fatigue reliability of nanoscale metal films on flexible substrates, here we proposed an effective evaluation way to obtain critical fatigue cracking strain based on the direct observation of fatigue damage sites through conventional dynamic bending testing technique. By this method, fatigue properties and damage behaviors of 930 nm-thick Au films and 600 nm-thick Mo-W multilayers with individual layer thickness 100 nm on flexible polyimide substrates were investigated. Coffin-Manson relationship between the fatigue life and the applied strain range was obtained for the Au films and Mo-Wmultilayers. The characterization of fatigue damage behaviors verifies the feasibility of this method, which seems easier and more effective comparing with the other testing methods.; In order to evaluate fatigue reliability of nanoscale metal films on flexible substrates, here we proposed an effective evaluation way to obtain critical fatigue cracking strain based on the direct observation of fatigue damage sites through conventional dynamic bending testing technique. By this method, fatigue properties and damage behaviors of 930 nm-thick Au films and 600 nm-thick Mo-W multilayers with individual layer thickness 100 nm on flexible polyimide substrates were investigated. Coffin-Manson relationship between the fatigue life and the applied strain range was obtained for the Au films and Mo-Wmultilayers. The characterization of fatigue damage behaviors verifies the feasibility of this method, which seems easier and more effective comparing with the other testing methods.
部门归属[zheng, si-xue ; luo, xue-mei ; zhang, guang-ping] chinese acad sci, inst met res, shenyang natl lab mat sci synl, 72 wenhua rd, shenyang 110016, liaoning, peoples r china ; [zheng, si-xue] univ sci & technol china, sch mat sci & engn, shenyang 110016, liaoning, peoples r china ; [wang, dong] ilmenau univ technol, dept mat elect, inst mat, engn, pob 10 05 65, d-98684 ilmenau, germany ; [wang, dong] ilmenau univ technol, inst micro & nanotechnol, macronano, pob 10 05 65, d-98684 ilmenau, germany
关键词Cu Thin-films Damage Formation Length Scale Gold-films Behavior Stretchability Deformation Specimens Thickness Size
学科领域Materials Science, Multidisciplinary
资助者National Natural Science Foundation of China (NSFC) [51601198, 51571199]; NSFC [51371180]; IMR SYNL-T.S. Ke Research Fellowship [Y6N7611161]
收录类别SCI
语种英语
文献类型期刊论文
条目标识符http://ir.imr.ac.cn/handle/321006/79458
专题中国科学院金属研究所
通讯作者Luo, XM; Zhang, GP (reprint author), Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci SYNL, 72 Wenhua Rd, Shenyang 110016, Liaoning, Peoples R China.
推荐引用方式
GB/T 7714
Zheng, SX,Luo, XM,Wang, D,et al. A novel evaluation strategy for fatigue reliability of flexible nanoscale films[J]. MATERIALS RESEARCH EXPRESS,2018,5(3):-.
APA Zheng, SX,Luo, XM,Wang, D,Zhang, GP,&Zhang, GP .(2018).A novel evaluation strategy for fatigue reliability of flexible nanoscale films.MATERIALS RESEARCH EXPRESS,5(3),-.
MLA Zheng, SX,et al."A novel evaluation strategy for fatigue reliability of flexible nanoscale films".MATERIALS RESEARCH EXPRESS 5.3(2018):-.
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