Artifacts induced in metallic glasses during TEM sample preparation

doi:10.1016/j.scriptamat.2005.06.007

IMR OpenIR

	Artifacts induced in metallic glasses during TEM sample preparation
	Sun, BB ; Wang, YB ; Wen, J ; Yang, H ; Sui, ML ; Wang, JQ ; Ma, E
通讯作者	Sui, ML(mlsui@imr.ac.cn)
	2005-10-01
发表期刊	SCRIPTA MATERIALIA
ISSN	1359-6462
卷号	53 期号:7 页码:805-809
摘要	The objective of this study is to demonstrate the various artificial features introduced into metallic amorphous alloys by improper TEM sample preparation. Such artifacts are often confused with the intrinsic microstructures when examining metallic glasses under TEM. The electropolishing and ion milling procedures are compared in terms of their merits/drawbacks for avoiding/inducing artifacts in metallic glass samples. (c) 2005 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
关键词	metallic glass TEM sample preparation HRTEM HAADF
DOI	10.1016/j.scriptamat.2005.06.007
收录类别	SCI
语种	英语
WOS研究方向	Science & Technology - Other Topics ; Materials Science ; Metallurgy & Metallurgical Engineering
WOS类目	Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Metallurgy & Metallurgical Engineering
WOS记录号	WOS:000231341800004
出版者	PERGAMON-ELSEVIER SCIENCE LTD
引用统计	被引频次：51[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/83603
专题	中国科学院金属研究所
通讯作者	Sui, ML
作者单位	1.Johns Hopkins Univ, Dept Mat Sci & Engn, Baltimore, MD 21218 USA 2.Chinese Acad Sci, Met Res Inst, SYNL, Shenyang 110016, Peoples R China
推荐引用方式 GB/T 7714	Sun, BB,Wang, YB,Wen, J,et al. Artifacts induced in metallic glasses during TEM sample preparation[J]. SCRIPTA MATERIALIA,2005,53(7):805-809.
APA	Sun, BB.,Wang, YB.,Wen, J.,Yang, H.,Sui, ML.,...&Ma, E.(2005).Artifacts induced in metallic glasses during TEM sample preparation.SCRIPTA MATERIALIA,53(7),805-809.
MLA	Sun, BB,et al."Artifacts induced in metallic glasses during TEM sample preparation".SCRIPTA MATERIALIA 53.7(2005):805-809.