Structural stability of single-layered LaNi4.25Al0.75 film and its electrochemical hydrogen-storage properties

IMR OpenIR

	Structural stability of single-layered LaNi4.25Al0.75 film and its electrochemical hydrogen-storage properties
	Wang Zhongmin ; Li, Chi Ying Vanessa ; Zhou Huaiying ; Chan, Sammy Lap Ip ; Shi Liu
通讯作者	Wang Zhongmin(zmwang@gliet.edu.cn)
	2006-10-01
发表期刊	RARE METALS
ISSN	1001-0521
卷号	25 期号:5 页码:543-548
摘要	AB(5)-based hydrogen storage thin films (LaNi4.25Al0.75), deposited on Cu substrate by dc magnetron sputtering were investigated in this study. X-ray diffraction (XRD) revealed that the microstructure of the layer was in crystal form. SEM and AFM analyses proved that the film appeared to be rather rough with numerous randomly sized pores of approximately 15-40 in nm diameter. Structural stability of the film was examined by the combined analyses of DSC, XRD, and SEM, which indicated that this film maintained its structural stability below 500 K or so, and a network structure was observed on the film after being heated at 700 K for 30 min. Electrochemical hydrogen-storage properties of the films were investigated by simulated battery tests. It was found that single-layered LaNi4.25Al0.75 film exhibited electrochemical hydrogen-storage properties similar to typical AB(5) alloys in bulk, and the maximum discharge capacity of the film was about 220 mAh/g. After 20 charge/discharge cycles, small needle-shaped aluminium oxide was formed on some fractions of the film surface.
关键词	hydrogen storage thin film magnetron sputtering structural stability electrochemical properties
收录类别	SCI
语种	英语
WOS研究方向	Materials Science ; Metallurgy & Metallurgical Engineering
WOS类目	Materials Science, Multidisciplinary ; Metallurgy & Metallurgical Engineering
WOS记录号	WOS:000241007300025
出版者	NONFERROUS METALS SOCIETY CHINA
引用统计	被引频次：2[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/85790
专题	中国科学院金属研究所
通讯作者	Wang Zhongmin
作者单位	1.Guilin Univ Elect Technol, Ctr Mat Sci & Engn, Guilin 541004, Peoples R China 2.Univ New S Wales, Sch Mat Sci & Engn, Sydney, NSW 2052, Australia 3.Chinese Acad Sci, Met Res Inst, Beijing 100864, Peoples R China
推荐引用方式 GB/T 7714	Wang Zhongmin,Li, Chi Ying Vanessa,Zhou Huaiying,et al. Structural stability of single-layered LaNi4.25Al0.75 film and its electrochemical hydrogen-storage properties[J]. RARE METALS,2006,25(5):543-548.
APA	Wang Zhongmin,Li, Chi Ying Vanessa,Zhou Huaiying,Chan, Sammy Lap Ip,&Shi Liu.(2006).Structural stability of single-layered LaNi4.25Al0.75 film and its electrochemical hydrogen-storage properties.RARE METALS,25(5),543-548.
MLA	Wang Zhongmin,et al."Structural stability of single-layered LaNi4.25Al0.75 film and its electrochemical hydrogen-storage properties".RARE METALS 25.5(2006):543-548.