Microstructure and microanalysis of BaNb0.2Ti0.8O3 thin film

doi:10.1016/j.matchemphys.2008.06.033

IMR OpenIR

	Microstructure and microanalysis of BaNb0.2Ti0.8O3 thin film
	Zhang, M.1,2; Ma, X. L.2; Li, D. X.2; Xie, S. J.1,3; Chang, R. P. H.1,3
通讯作者	Zhang, M.(ming-zhang@northwestern.edu)
	2008-12-20
发表期刊	MATERIALS CHEMISTRY AND PHYSICS
ISSN	0254-0584
卷号	112 期号:3 页码:756-761
摘要	Perovskite-based BaNb0.2Ti0.8O3 (BNTO) thin film, grown by computer-controlled laser molecular beam epitaxy on SrTiO3 (001) substrate, was investigated by means of high-resolution electron microscopic (HREM) imaging, high-angle annular dark-field (HAADF) imaging, and X-ray energy dispersive spectrometric (XEDS) line-scanning in a transmission electron microscope. The microstructure of the BaNb0.2Ti0.8O3 film is clarified in terms of various domains due to tetragonal characteristics. Compositional fluctuation was observed in the various domains and domain boundaries. The misfit strain and element diffusivity during the film growth together with inherent tetragonal characteristics are discussed as a possible mechanism for the formation and distribution of various domains. (C) 2008 Elsevier B.V. All rights reserved.
关键词	Microstructure characterization Transmission electron microscopy Interface structure Defects Orientation relationship Perovskite thin films
资助者	National Outstanding Young Scientist Foundation ; Special Funds for the Major State Basic Research Projects of China
DOI	10.1016/j.matchemphys.2008.06.033
收录类别	SCI
语种	英语
资助项目	National Outstanding Young Scientist Foundation[50325101] ; Special Funds for the Major State Basic Research Projects of China[2002CB613503]
WOS研究方向	Materials Science
WOS类目	Materials Science, Multidisciplinary
WOS记录号	WOS:000262183900011
出版者	ELSEVIER SCIENCE SA
引用统计
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/95399
专题	中国科学院金属研究所
通讯作者	Zhang, M.
作者单位	1.Northwestern Univ, Dept Mat Sci & Engn, Evanston, IL 60208 USA 2.Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China 3.Northwestern Univ, Inst Mat Res, Evanston, IL 60208 USA
推荐引用方式 GB/T 7714	Zhang, M.,Ma, X. L.,Li, D. X.,et al. Microstructure and microanalysis of BaNb0.2Ti0.8O3 thin film[J]. MATERIALS CHEMISTRY AND PHYSICS,2008,112(3):756-761.
APA	Zhang, M.,Ma, X. L.,Li, D. X.,Xie, S. J.,&Chang, R. P. H..(2008).Microstructure and microanalysis of BaNb0.2Ti0.8O3 thin film.MATERIALS CHEMISTRY AND PHYSICS,112(3),756-761.
MLA	Zhang, M.,et al."Microstructure and microanalysis of BaNb0.2Ti0.8O3 thin film".MATERIALS CHEMISTRY AND PHYSICS 112.3(2008):756-761.