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Image matching between experimental and simulated high-resolution electron micrographs of sapphire on the [0(1)over-bar10] orientation 期刊论文
JOURNAL OF MICROSCOPY, 2008, 卷号: 232, 期号: 1, 页码: 137-144
作者:  Du, K.;  Ruehle, M.
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high-resolution transmission electron microscopy  image simulation  quantitative electron microscopy  sapphire