中文版 | English

在结果中检索

IMR OpenIR

浏览/检索结果: 共1条，第1-1条 帮助

已选(0)清除 条数/页：   排序方式：
Effects of annealing treatment on the microstructure evolution and the strength degradation behavior of the commercially pure Al conductor 期刊论文
ELSEVIER SCIENCE SA, 2017, 卷号: 707, 页码: 511-517
作者:  Hou, J. P.;  Chen, Q. Y.;  Wang, Q.;  Yu, H. Y.;  Zhang, Z. J.;  Li, R.;  Li, X. W.;  Zhang, Z. F.;  Wang, Q;  Zhang, ZF (reprint author), Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, 72 Wenhua Rd, Shenyang 110016, Liaoning, Peoples R China.
收藏  |  浏览/下载：139/0  |  提交时间：2018/01/10
CommerciAlly Pure Al Conductor  Strength  Annealing Treatment  Texture Evolution