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Large-deformation analysis in microscopic area using micro-moire methods with a focused ion beam milling grating 期刊论文
Optics and Lasers in Engineering, 2007, 卷号: 45, 期号: 12, 页码: 1157-1169
作者:  H. Du;  H. M. Xie;  Z. L. Guo;  B. Pan;  Q. Luo;  C. Z. Gu;  H. C. Jiang;  L. J. Rong
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Sem Moire  Digital Moire  Fib Milling Grating  Large-deformation  Measurement  Shear Band  Shape-memory Alloy  Automatic Fringe Analysis  Stress-strain Behavior  Tini  Interferometry  Fabrication  Algorithm  Powders