| Microstructural evolution of [PbZrxTi1-xO3/PbZryTi1-yO3](n) epitaxial multilayers (x/y=0.2/0.4, 0.4/0.6) - dependence on layer thickness | |
| Zhu, Y. L.1; Zheng, S. J.1; Ma, X. L.1; Feigl, L.2; Alexe, M.2; Hesse, D.2; Vrejoiu, I.2 | |
| Corresponding Author | Zhu, Y. L.(ylzhu@imr.ac.cn) |
| 2010 | |
| Source Publication | PHILOSOPHICAL MAGAZINE
 |
| ISSN | 1478-6435 |
| Volume | 90Issue:10Pages:1359-1372 |
| Abstract | The microstructure of ferroelectric [PbZrxTi1-xO3/PbZryTi1-yO3](n) epitaxial multilayers (x/y 0.2/0.4, 0.4/0.6) deposited on SrRuO3-coated SrTiO3 substrates by pulsed-laser deposition with different layer periodicity and layer thickness was characterized by means of transmission electron microscopy. Electron diffraction and contrast analysis revealed a very clear and well-separated layer sequence. The microstructures of PbZr0.2Ti0.8O3/PbZr0.4Ti0.6O3 and PbZr0.4Ti0.6O3/PbZr0.6Ti0.4O3 multilayers show a similar tendency in the dependence on the individual layer thickness. Whereas with thick individual layers, tetragonal a-domains are confined to specific layers of the two types of multilayers, below a certain critical thickness of the individual layers, a-domains extend over the whole film. This indicates a transition into a uniform tetragonal lattice and strain state of the whole multilayer. Increasing the layer periodicity further, the interfaces in PbZr0.4Ti0.6O3/PbZr0.6Ti0.4O3 multilayers become rough, and complex a-domain configurations appear. |
| Keyword | ferroelectrics transmission electron microscopy microstructure |
| Funding Organization | National Basic Research Program of China ; National Natural Science Foundation of China ; German Research Foundation (DFG) |
| DOI | 10.1080/14786430903352656 |
| Indexed By | SCI |
| Language | 英语 |
| Funding Project | National Basic Research Program of China[2009CB623705] ; National Natural Science Foundation of China[50871115] ; German Research Foundation (DFG)[FOR 404] ; German Research Foundation (DFG)[SFB 762] |
| WOS Research Area | Materials Science ; Mechanics ; Metallurgy & Metallurgical Engineering ; Physics |
| WOS Subject | Materials Science, Multidisciplinary ; Mechanics ; Metallurgy & Metallurgical Engineering ; Physics, Applied ; Physics, Condensed Matter |
| WOS ID | WOS:000276638400008 |
| Publisher | TAYLOR & FRANCIS LTD |
| Citation statistics | |
| Document Type | 期刊论文 |
| Identifier | http://ir.imr.ac.cn/handle/321006/102416 |
| Collection | 中国科学院金属研究所 |
| Corresponding Author | Zhu, Y. L. |
| Affiliation | 1.Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China 2.Max Planck Inst Microstruct Phys, D-06120 Halle, Germany |
| Recommended Citation GB/T 7714 | Zhu, Y. L.,Zheng, S. J.,Ma, X. L.,et al. Microstructural evolution of [PbZrxTi1-xO3/PbZryTi1-yO3](n) epitaxial multilayers (x/y=0.2/0.4, 0.4/0.6) - dependence on layer thickness[J]. PHILOSOPHICAL MAGAZINE,2010,90(10):1359-1372. |
| APA | Zhu, Y. L..,Zheng, S. J..,Ma, X. L..,Feigl, L..,Alexe, M..,...&Vrejoiu, I..(2010).Microstructural evolution of [PbZrxTi1-xO3/PbZryTi1-yO3](n) epitaxial multilayers (x/y=0.2/0.4, 0.4/0.6) - dependence on layer thickness.PHILOSOPHICAL MAGAZINE,90(10),1359-1372. |
| MLA | Zhu, Y. L.,et al."Microstructural evolution of [PbZrxTi1-xO3/PbZryTi1-yO3](n) epitaxial multilayers (x/y=0.2/0.4, 0.4/0.6) - dependence on layer thickness".PHILOSOPHICAL MAGAZINE 90.10(2010):1359-1372. |
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