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Microstructural evolution of PbZr(x)Ti(1-x)O(3)/PbZr(y)Ti(1-y)O(3) (n) epitaxial multilayers (x/y=0.2/0.4, 0.4/0.6) - dependence on layer thickness 期刊论文
Philosophical Magazine, 2010, 卷号: 90, 期号: 10, 页码: 1359-1372
Authors:  Y. L. Zhu;  S. J. Zheng;  X. L. Ma;  L. Feigl;  M. Alexe;  D. Hesse;  I. Vrejoiu
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Ferroelectrics  Transmission Electron Microscopy  Microstructure  Ferroelectric Thin-films  Misfit Relaxation Mechanisms  Domain  Configurations  Heterostructures  Polarization  
Microstructural evolution of [PbZrxTi1-xO3/PbZryTi1-yO3](n) epitaxial multilayers (x/y=0.2/0.4, 0.4/0.6) - dependence on layer thickness 期刊论文
PHILOSOPHICAL MAGAZINE, 2010, 卷号: 90, 期号: 10, 页码: 1359-1372
Authors:  Zhu, Y. L.;  Zheng, S. J.;  Ma, X. L.;  Feigl, L.;  Alexe, M.;  Hesse, D.;  Vrejoiu, I.
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ferroelectrics  transmission electron microscopy  microstructure  
Impact of high interface density on ferroelectric and structural properties of PbZr0.2Ti0.8O3/PbZr0.4Ti0.6O3 epitaxial multilayers 期刊论文
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2009, 卷号: 42, 期号: 8, 页码: 6
Authors:  Feigl, L.;  Zheng, S. J.;  Birajdar, B. I.;  Rodriguez, B. J.;  Zhu, Y. L.;  Alexe, M.;  Hesse, D.
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Impact of high interface density on ferroelectric and structural properties of PbZr(0.2)Ti(0.8)O(3)/PbZr(0.4)Ti(0.6)O(3) epitaxial multilayers 期刊论文
Journal of Physics D-Applied Physics, 2009, 卷号: 42, 期号: 8
Authors:  L. Feigl;  S. J. Zheng;  B. I. Birajdar;  B. J. Rodriguez;  Y. L. Zhu;  M. Alexe;  D. Hesse
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Thin-films  Dislocations  Layer