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Thickness dependence of domain size in 2D ferroelectric CuInP2S6 nanoflakes
Chen, Liufang1,2; Li, Yongqiang1,2; Li, Chuanfu1,2; Wang, Hanwen3; Han, Zheng3; Ma, He4; Yuan, Guoliang4; Lin, Lin1,2; Yan, Zhibo1,2; Jiang, Xiangping5; Liu, Jun-Ming1,2
Corresponding AuthorLiu, Jun-Ming(liujm@nju.edu.cn)
2019-11-01
Source PublicationAIP ADVANCES
Volume9Issue:11Pages:6
AbstractTwo-dimensional (2D) ferroelectrics refer to those ferroelectrics with layered structure and weak interlayer interactions (e.g., van de Waals interlayer coupling). A number of basic physical issues in the framework of ferroelectricity deserve clarifications, and one of them is the size effect regarding the dependence of ferroelectricity on material thickness. In this work, we investigate the ferroelectric domain structures of 2D ferroelectric CuInP2S6 nanoflakes attached on heavily doped Si wafers and polarization switching using the piezoresponse force microscopy. While the domain structure shows highly irregular morphology and 180 degrees domain walls, the statistics on domain size (diameter) W and nanoflake thickness d demonstrates the remarkable thickness dependence of domain size, illustrated by the shrinking domain size from 630 nm to 75 nm with decreasing thickness d from similar to 130 nm to similar to 11 nm. This dependence fits the Landau-Lifshitz-Kittel (LLK) scaling law with the scaling exponent of similar to 0.65, slightly larger than 0.5 for 3D ferroelectrics. It is suggested that the size effect in terms of the LLK scaling law does not show an essential difference between the 2D and 3D ferroelectric systems. (C) 2019 Author(s).
Funding OrganizationNational Key Projects for Basic Researches of China ; National Natural Science Foundation of China
DOI10.1063/1.5123366
Indexed BySCI
Language英语
Funding ProjectNational Key Projects for Basic Researches of China[2016YFA0300101] ; National Key Projects for Basic Researches of China[2015CB654602] ; National Natural Science Foundation of China[51431006] ; National Natural Science Foundation of China[11834002] ; National Natural Science Foundation of China[51721001]
WOS Research AreaScience & Technology - Other Topics ; Materials Science ; Physics
WOS SubjectNanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Physics, Applied
WOS IDWOS:000504341600054
PublisherAMER INST PHYSICS
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Cited Times:2[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/136533
Collection中国科学院金属研究所
Corresponding AuthorLiu, Jun-Ming
Affiliation1.Nanjing Univ, Lab Solid State Microstruct, Nanjing 210093, Jiangsu, Peoples R China
2.Nanjing Univ, Dept Phys, Nanjing 210093, Jiangsu, Peoples R China
3.Chinese Acad Sci, Inst Met Res, Shenyang 110016, Liaoning, Peoples R China
4.Nanjing Univ Sci & Technol, Sch Mat Sci & Engn, Nanjing 210094, Jiangsu, Peoples R China
5.Jingdezhen Ceram Inst, Sch Mat Sci & Engn, Jingdezhen 333403, Peoples R China
Recommended Citation
GB/T 7714
Chen, Liufang,Li, Yongqiang,Li, Chuanfu,et al. Thickness dependence of domain size in 2D ferroelectric CuInP2S6 nanoflakes[J]. AIP ADVANCES,2019,9(11):6.
APA Chen, Liufang.,Li, Yongqiang.,Li, Chuanfu.,Wang, Hanwen.,Han, Zheng.,...&Liu, Jun-Ming.(2019).Thickness dependence of domain size in 2D ferroelectric CuInP2S6 nanoflakes.AIP ADVANCES,9(11),6.
MLA Chen, Liufang,et al."Thickness dependence of domain size in 2D ferroelectric CuInP2S6 nanoflakes".AIP ADVANCES 9.11(2019):6.
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