Thickness dependence of domain size in 2D ferroelectric CuInP2S6 nanoflakes

doi:10.1063/1.5123366

IMR OpenIR

	Thickness dependence of domain size in 2D ferroelectric CuInP2S6 nanoflakes
	Chen, Liufang 1,2; Li, Yongqiang 1,2; Li, Chuanfu 1,2; Wang, Hanwen 3; Han, Zheng 3; Ma, He 4; Yuan, Guoliang 4; Lin, Lin 1,2; Yan, Zhibo 1,2; Jiang, Xiangping 5; Liu, Jun-Ming 1,2
通讯作者	Liu, Jun-Ming(liujm@nju.edu.cn)
	2019-11-01
发表期刊	AIP ADVANCES
卷号	9 期号:11 页码:6
摘要	Two-dimensional (2D) ferroelectrics refer to those ferroelectrics with layered structure and weak interlayer interactions (e.g., van de Waals interlayer coupling). A number of basic physical issues in the framework of ferroelectricity deserve clarifications, and one of them is the size effect regarding the dependence of ferroelectricity on material thickness. In this work, we investigate the ferroelectric domain structures of 2D ferroelectric CuInP2S6 nanoflakes attached on heavily doped Si wafers and polarization switching using the piezoresponse force microscopy. While the domain structure shows highly irregular morphology and 180 degrees domain walls, the statistics on domain size (diameter) W and nanoflake thickness d demonstrates the remarkable thickness dependence of domain size, illustrated by the shrinking domain size from 630 nm to 75 nm with decreasing thickness d from similar to 130 nm to similar to 11 nm. This dependence fits the Landau-Lifshitz-Kittel (LLK) scaling law with the scaling exponent of similar to 0.65, slightly larger than 0.5 for 3D ferroelectrics. It is suggested that the size effect in terms of the LLK scaling law does not show an essential difference between the 2D and 3D ferroelectric systems. (C) 2019 Author(s).
资助者	National Key Projects for Basic Researches of China ; National Natural Science Foundation of China
DOI	10.1063/1.5123366
收录类别	SCI
语种	英语
资助项目	National Key Projects for Basic Researches of China[2016YFA0300101] ; National Key Projects for Basic Researches of China[2015CB654602] ; National Natural Science Foundation of China[51431006] ; National Natural Science Foundation of China[11834002] ; National Natural Science Foundation of China[51721001]
WOS研究方向	Science & Technology - Other Topics ; Materials Science ; Physics
WOS类目	Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Physics, Applied
WOS记录号	WOS:000504341600054
出版者	AMER INST PHYSICS
引用统计	被引频次：19[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/136533
专题	中国科学院金属研究所
通讯作者	Liu, Jun-Ming
作者单位	1.Nanjing Univ, Lab Solid State Microstruct, Nanjing 210093, Jiangsu, Peoples R China 2.Nanjing Univ, Dept Phys, Nanjing 210093, Jiangsu, Peoples R China 3.Chinese Acad Sci, Inst Met Res, Shenyang 110016, Liaoning, Peoples R China 4.Nanjing Univ Sci & Technol, Sch Mat Sci & Engn, Nanjing 210094, Jiangsu, Peoples R China 5.Jingdezhen Ceram Inst, Sch Mat Sci & Engn, Jingdezhen 333403, Peoples R China
推荐引用方式 GB/T 7714	Chen, Liufang,Li, Yongqiang,Li, Chuanfu,et al. Thickness dependence of domain size in 2D ferroelectric CuInP2S6 nanoflakes[J]. AIP ADVANCES,2019,9(11):6.
APA	Chen, Liufang.,Li, Yongqiang.,Li, Chuanfu.,Wang, Hanwen.,Han, Zheng.,...&Liu, Jun-Ming.(2019).Thickness dependence of domain size in 2D ferroelectric CuInP2S6 nanoflakes.AIP ADVANCES,9(11),6.
MLA	Chen, Liufang,et al."Thickness dependence of domain size in 2D ferroelectric CuInP2S6 nanoflakes".AIP ADVANCES 9.11(2019):6.