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A unified model for determining fracture strain of metal films on flexible substrates
Wu, Xu-Ping1,2; Luo, Xue-Mei1; Chen, Hong-Lei1,2; Zou, Ji-Peng1,2; Zhang, Guang-Ping1
Corresponding AuthorLuo, Xue-Mei(xmluo@imr.ac.cn) ; Zhang, Guang-Ping(gpzhang@imr.ac.cn)
2020-10-01
Source PublicationJOURNAL OF MATERIALS SCIENCE & TECHNOLOGY
ISSN1005-0302
Volume54Pages:87-94
AbstractFailure strain determination of polymer-supported thin films is a key for the design of the flexible devices. A theoretical model R/R-0 =(L/L-0)(2) (R, L are the electrical resistance and the length of the stretched film, respectively. R-0, L-0 are the corresponding initial values.) has been widely used to determine the fracture strain of thin films on flexible substrates. However, this equation loses its function in some special cases. Here, a simple and universal theoretical model was proposed to determine the fracture strain of metal thin films on flexible substrates in more generally situations. With this model, we investigated the thickness-dependent failure strains of Cu-5 at.% Al films with thickness of 10 nm, 200 nm, 1000 nm, and Ti films with thickness of 50 nm, 100 nm, 300 nm. This model was also employed to study the published data available. The results showed that the new model provided a fairly good prediction of the failure strains of different films. (C) 2020 Published by Elsevier Ltd on behalf of The editorial office of Journal of Materials Science & Technology.
KeywordThin films Fracture Electrical resistance Microstructure Flexible substrate
Funding OrganizationNational Natural Science Foundation of China ; Foundation for Outstanding Young Scholar, Institute of Metal Research (IMR), China ; Natural Science Foundation of Liaoning Province of China ; Foundation for Outstanding Young Scholar ; Shenyang National Laboratory for Materials Science, China
DOI10.1016/j.jmst.2020.03.043
Indexed BySCI
Language英语
Funding ProjectNational Natural Science Foundation of China[51601198] ; National Natural Science Foundation of China[51571199] ; Foundation for Outstanding Young Scholar, Institute of Metal Research (IMR), China ; Natural Science Foundation of Liaoning Province of China[20180510025] ; Foundation for Outstanding Young Scholar ; Shenyang National Laboratory for Materials Science, China[L2019F23]
WOS Research AreaMaterials Science ; Metallurgy & Metallurgical Engineering
WOS SubjectMaterials Science, Multidisciplinary ; Metallurgy & Metallurgical Engineering
WOS IDWOS:000545310500010
PublisherJOURNAL MATER SCI TECHNOL
Citation statistics
Cited Times:2[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/139686
Collection中国科学院金属研究所
Corresponding AuthorLuo, Xue-Mei; Zhang, Guang-Ping
Affiliation1.Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China
2.Univ Sci & Technol China, Sch Mat Sci & Engn, Shenyang 110016, Peoples R China
Recommended Citation
GB/T 7714
Wu, Xu-Ping,Luo, Xue-Mei,Chen, Hong-Lei,et al. A unified model for determining fracture strain of metal films on flexible substrates[J]. JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY,2020,54:87-94.
APA Wu, Xu-Ping,Luo, Xue-Mei,Chen, Hong-Lei,Zou, Ji-Peng,&Zhang, Guang-Ping.(2020).A unified model for determining fracture strain of metal films on flexible substrates.JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY,54,87-94.
MLA Wu, Xu-Ping,et al."A unified model for determining fracture strain of metal films on flexible substrates".JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY 54(2020):87-94.
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