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Achieving very high cycle fatigue performance of Au thin films for flexible electronic applications
Chen, Hong-Lei1,2; Luo, Xue-Mei1; Wang, Dong3,4; Schaaf, Peter3,4; Zhang, Guang-Ping1
Corresponding AuthorLuo, Xue-Mei(xmluo@imr.ac.cn) ; Zhang, Guang-Ping(gpzhang@imr.ac.cn)
2021-10-30
Source PublicationJOURNAL OF MATERIALS SCIENCE & TECHNOLOGY
ISSN1005-0302
Volume89Pages:107-113
AbstractThe fatigue damage behavior of the nanocrystalline Au films on polyimide substrates was investigated. It was found that the very high-cycle fatigue damage resistance of the Au film was significantly enhanced by at least a factor of similar to 2 in supported loading through adding an ultrathin Ti interlayer at the Au film/polyimide interface. Such a better fatigue damage resistance is mainly ascribed to the effective suppression of voiding at the Au film/polyimide interface through modulation of the Au/Ti interface, and thus the propensity of the cyclic strain localization and grain boundary cracking is reduced. The finding may provide a potential strategy for the design of flexible devices with ultra-long fatigue life. (C) 2021 Published by Elsevier Ltd on behalf of The editorial office of Journal of Materials Science & Technology.
KeywordThin films Ti interlayer Fatigue Extrusion Interface
Funding OrganizationNational Natural Science Foundation of China (NSFC) ; Institute of Metal Research (IMR) ; Natural Science Foundation of Liaoning Province of China ; Shenyang National Laboratory for Materials Science
DOI10.1016/j.jmst.2021.02.025
Indexed BySCI
Language英语
Funding ProjectNational Natural Science Foundation of China (NSFC)[52071319] ; National Natural Science Foundation of China (NSFC)[51601198] ; National Natural Science Foundation of China (NSFC)[51771207] ; Institute of Metal Research (IMR) ; Natural Science Foundation of Liaoning Province of China[20180510025] ; Shenyang National Laboratory for Materials Science[L2019F23]
WOS Research AreaMaterials Science ; Metallurgy & Metallurgical Engineering
WOS SubjectMaterials Science, Multidisciplinary ; Metallurgy & Metallurgical Engineering
WOS IDWOS:000697346300002
PublisherJOURNAL MATER SCI TECHNOL
Citation statistics
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/167024
Collection中国科学院金属研究所
Corresponding AuthorLuo, Xue-Mei; Zhang, Guang-Ping
Affiliation1.Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China
2.Univ Sci & Technol China, Sch Mat Sci & Engn, Shenyang 110016, Peoples R China
3.TU Ilmenau, Inst Mat Engn, Gustav Kirchhoff Str 5, D-98693 Ilmenau, Germany
4.TU Ilmenau, Inst Micro & Nanotechnol MacroNano, Gustav Kirchhoff Str 5, D-98693 Ilmenau, Germany
Recommended Citation
GB/T 7714
Chen, Hong-Lei,Luo, Xue-Mei,Wang, Dong,et al. Achieving very high cycle fatigue performance of Au thin films for flexible electronic applications[J]. JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY,2021,89:107-113.
APA Chen, Hong-Lei,Luo, Xue-Mei,Wang, Dong,Schaaf, Peter,&Zhang, Guang-Ping.(2021).Achieving very high cycle fatigue performance of Au thin films for flexible electronic applications.JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY,89,107-113.
MLA Chen, Hong-Lei,et al."Achieving very high cycle fatigue performance of Au thin films for flexible electronic applications".JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY 89(2021):107-113.
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