中文版 | English

在结果中检索

IMR OpenIR

浏览/检索结果: 共18条，第1-10条 帮助

已选(0)清除 条数/页：   排序方式：
Microstructure and physical properties of epsilon-Fe2O3 thin films fabricated by pulsed laser deposition 期刊论文
MICRON, 2022, 卷号: 163, 页码: 6
作者:  Chen, Shanshan;  Jiang, Yixiao;  Yao, Tingting;  Tao, Ang;  Yan, Xuexi;  Liu, Fang;  Chen, Chunlin;  Ma, Xiuliang;  Ye, Hengqiang
收藏  |  浏览/下载：45/0  |  提交时间：2023/05/09
epsilon-Fe2O3  Thin film  Pulsed laser deposition  Transmission electron microscopy  Physical properties  
In situ observation of twin-assisted grain growth in nanometer-scaled metal 期刊论文
MICRON, 2020, 卷号: 131, 页码: 8
作者:  He, Suyun;  Wang, Chunyang;  Qi, Lu;  Ye, Hengqiang;  Du, Kui
收藏  |  浏览/下载：114/0  |  提交时间：2021/02/02
Nanometer-scaled materials  Microstructure  Grain boundaries  Deformation twinning  
In situ observation of twin-assisted grain growth in nanometer-scaled metal 期刊论文
MICRON, 2020, 卷号: 131, 页码: 8
作者:  He, Suyun;  Wang, Chunyang;  Qi, Lu;  Ye, Hengqiang;  Du, Kui
收藏  |  浏览/下载：109/0  |  提交时间：2021/02/02
Nanometer-scaled materials  Microstructure  Grain boundaries  Deformation twinning  
Atomic structure and chemistry of a[100] dislocation cores in La2/3Sr1/3MnO3 films 期刊论文
MICRON, 2017, 卷号: 96, 页码: 72-76
作者:  Song, Kepeng;  Du, Kui;  Ye, Hengqiang;  Du, K (reprint author), Chinese Acad Sci, Shenyang Natl Lab Mat Sci, Inst Met Res, Shenyang 110016, Peoples R China.
收藏  |  浏览/下载：118/0  |  提交时间：2017/08/17
La2/3sr1/3mno3  Dislocation  Stem  Eels  Antisite  
In situ tracking the reversible spinel-rocksalt structural transformation between Mn3O4 and MnO 期刊论文
MICRON, 2017, 卷号: 92, 页码: 13-18
作者:  San, Xingyuan;  Zhang, Bo;  Wang, Jing;  Wu, Bo;  Ma, Xiuliang;  Zhang, B (reprint author), Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Wenhua Rd 72, Shenyang 110016, Peoples R China.
收藏  |  浏览/下载：123/0  |  提交时间：2017/08/17
In-situ Transmission Electron Microscopy  Mn3o4  Reversible Transformation  Beam Irradiation  
Direct measurement of precipitate induced strain in an Al-Zn-Mg-Cu alloy with aberration corrected transmission electron microscopy 期刊论文
MICRON, 2016, 卷号: 90, 页码: 18-22
作者:  Ying, XR;  Du, YX;  Song, M;  Lu, N;  Ye, HQ;  Song, M (reprint author), Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China.
收藏  |  浏览/下载：149/0  |  提交时间：2016/12/28
Aberration Corrected Electron Microscopy  Quantitative Electron Microscopy  Strain Analysis  Precipitates  Aluminum Alloys  
High-resolution transmission electron microscopy study on reversion of Al2CuMg precipitates in Al-Cu-Mg alloys under irradiation 期刊论文
MICRON, 2015, 卷号: 76, 页码: 1-5
作者:  Zhao, Y. L.;  Hu, W. W.;  Yang, Z. Q.;  yangzq@imr.ac.cn
收藏  |  浏览/下载：165/0  |  提交时间：2016/04/21
Quantitative Hrtem  Al Alloy  Precipitate  Irradiation  Structural Reversion  
Medium range order of bulk metallic glasses determined by variable resolution fluctuation electron microscopy 期刊论文
Micron, 2012, 卷号: 43, 期号: 7, 页码: 827-831
作者:  J. W. Deng;  K. Du;  M. L. Sui
收藏  |  浏览/下载：116/0  |  提交时间：2013/02/05
Fluctuation Electron Microscopy  Medium-range Order  Bulk Metallic  Glasses  Transmission Electron Microscopy  Energy-loss Spectroscopy  Disordered Materials  Amorphous-carbon  Structural Order  Nanoscale Order  Thickness  Diffraction  Coherence  Alloys  Probe  
On the accuracy of maximum entropy reconstruction of high-resolution Z-contrast STEM images 期刊论文
Micron, 2009, 卷号: 40, 期号: 2, 页码: 247-254
作者:  X. H. Sang;  K. Du;  M. J. Zhuo;  H. Q. Ye
Adobe PDF(1414Kb)  |  收藏  |  浏览/下载：128/0  |  提交时间：2012/04/13
Scanning Transmission Electron Microscopy  High-angle Annular Dark-field  Image (Haadf)  Image Processing  Quantitative Electron Microscopy  Transmission Electron-microscopy  Dark-field Images  Grain-boundaries  Adf Stem  Chemistry  Silicon  
Measurement of crystal thickness and orientation from selected-area Fourier transformation of a high-resolution electron hologram 期刊论文
MICRON, 2006, 卷号: 37, 期号: 1, 页码: 67-72
作者:  Du, K;  Wang, YM;  Lichte, H;  Ye, HQ
收藏  |  浏览/下载：82/0  |  提交时间：2021/02/02
electron holography  high-resolution transmission electron microscopy  quantitative electron microscopy