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Quantitative comparison of image contrast and pattern between experimental and simulated high-resolution transmission electron micrographs 期刊论文
Ultramicroscopy, 2007, 卷号: 107, 期号: 4-5, 页码: 281-292
作者:  K. Du;  K. von Hochmeister;  F. Phillipp
收藏  |  浏览/下载：138/0  |  提交时间：2012/04/13
High-resolution Transmission Electron Microscopy  Image Simulation  Atomic-resolution  Noise Transfer  Ccd Cameras  Hrem  Scattering  Microscope  Diffraction  Holography  Package  Signal  
Nanoelectronic devices-resonant tunnelling diodes grown on InP substrates by molecular beam epitaxy with peak to valley current ratio of 17 at room temperature 期刊论文
CHINESE PHYSICS, 2006, 卷号: 15, 期号: 6, 页码: 1335-1338
作者:  Zhang, Y;  Zeng, YP;  Ma, L;  Wang, BQ;  Zhu, ZP;  Wang, LC;  Yang, FH
收藏  |  浏览/下载：74/0  |  提交时间：2021/02/02
resonant tunnelling diode  InP substrate  molecular beam epitaxy  high resolution transmission electron microscope  
alpha-PbO2-type nanophase of TiO2 from coesite-bearing eclogite in the Dabie Mountains, China - Reply 期刊论文
American Mineralogist, 2006, 卷号: 91, 期号: 10, 页码: 1701-1702
作者:  X. L. Wu;  D. W. Meng;  Y. J. Han
收藏  |  浏览/下载：66/0  |  提交时间：2012/04/14
Tio2  High-resolution Transmission Electron Microscope  Dabie Mountains  Uhp Metamorphism  
Arc-discharge synthesis and microstructure characterization of AlN nanowires 期刊论文
Journal of Materials Science & Technology, 2006, 卷号: 22, 期号: 1, 页码: 113-116
作者:  Z. J. Li;  Z. Q. Shen;  F. Wang;  L. L. He
收藏  |  浏览/下载：61/0  |  提交时间：2012/04/13
Arc-discharge  Nanowire  High-resolution Transmission Electron  Microscope (Hrtem)  Field-emission  Growth  Nanorods  
Microstructure and composition analysis of nanostructured materials using HREM and FEG-TEM 期刊论文
MICRON, 2000, 卷号: 31, 期号: 5, 页码: 581-586
作者:  Li, DX;  Ping, DH;  Huang, JY;  Yu, YD;  Ye, HQ
收藏  |  浏览/下载：84/0  |  提交时间：2021/02/02
nanostructured materials  grain boundary  defect structure  solubility  high-resolution electron microscope and field-emission-gun transmission electron microscope  
Microstructure and composition analysis of nanostructured materials using HREM and FEG-TEM 期刊论文
MICRON, 2000, 卷号: 31, 期号: 5, 页码: 581-586
作者:  Li, DX;  Ping, DH;  Huang, JY;  Yu, YD;  Ye, HQ
收藏  |  浏览/下载：66/0  |  提交时间：2021/02/02
nanostructured materials  grain boundary  defect structure  solubility  high-resolution electron microscope and field-emission-gun transmission electron microscope