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Microscopic investigation of strain localization and fatigue damage in thin Cu films 期刊论文
PRICM 5: THE FIFTH PACIFIC RIM INTERNATIONAL CONFERENCE ON ADVANCED MATERIALS AND PROCESSING, PTS 1-5, 2005, 卷号: 475-479, 页码: 3647-3650
Authors:  Zhang, GP;  Volkert, CA;  Schwaiger, R;  Kraft, O
Favorite  |  View/Download:1/0  |  Submit date:2021/02/02
thin films  fatigue  size effect  dislocation structure  length scale