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Mechanical annealing of Cu-Si nanowires during high-cycle fatigue
期刊论文
Mrs Communications, 2014, 卷号: 4, 期号: 3, 页码: 83-87
Authors:
C. Ensslen
;
O. Kraft
;
R. Monig
;
J. Xu
;
G. P. Zhang
;
R. Schneider
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View/Download:3/0
  |  
Submit date:2015/01/14
Nanocrystalline Copper
Plastic-deformation
Thin Copper
Nanowhiskers
Behavior
Crystals
Metals
Scale
Films
Wires
Fatigue and thermal fatigue damage analysis of thin metal films
期刊论文
Microelectronics Reliability, 2007, 卷号: 47, 期号: 12, 页码: 2007-2013
Authors:
G. P. Zhang
;
C. A. Volkert
;
R. Schwaiger
;
R. Monig
;
O. Kraft
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View/Download:6/0
  |  
Submit date:2012/04/13
High-cycle Fatigue
Copper-films
Mechanical-properties
Behavior
Size
Deformation
Specimens
Tension
Length-scale-controlled fatigue mechanisms in thin copper films
期刊论文
Acta Materialia, 2006, 卷号: 54, 期号: 11, 页码: 3127-3139
Authors:
G. P. Zhang
;
C. A. Volkert
;
R. Schwaiger
;
P. Wellner
;
E. Arzt
;
O. Kraft
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View/Download:4/0
  |  
Submit date:2012/04/14
Fatigue
Thin Films
Length Scale
Dislocation Structure
Interfaces
Severe Plastic-deformation
Ultrafine-grained Copper
Cyclic
Deformation
Strain Amplitude
Dislocation-structures
Crack Initiation
Single-crystals
Metal-films
Behavior
Size
Damage behavior of 200-nm thin copper films under cyclic loading
期刊论文
Journal of Materials Research, 2005, 卷号: 20, 期号: 1, 页码: 201-207
Authors:
G. P. Zhang
;
C. A. Volkert
;
R. Schwaiger
;
E. Arzt
;
O. Kraft
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View/Download:4/0
  |  
Submit date:2012/04/14
Crack Initiation
Fatigue Behavior
Single-crystals
Metal-films
Dislocation-structures
Grain-size
Deformation
Compression
Thickness
Tension
Microscopic investigation of strain localization and fatigue damage in thin Cu films
期刊论文
PRICM 5: THE FIFTH PACIFIC RIM INTERNATIONAL CONFERENCE ON ADVANCED MATERIALS AND PROCESSING, PTS 1-5, 2005, 卷号: 475-479, 页码: 3647-3650
Authors:
Zhang, GP
;
Volkert, CA
;
Schwaiger, R
;
Kraft, O
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View/Download:1/0
  |  
Submit date:2021/02/02
thin films
fatigue
size effect
dislocation structure
length scale
Effect of film thickness and grain size on fatigue-induced dislocation structures in Cu thin films
期刊论文
Philosophical Magazine Letters, 2003, 卷号: 83, 期号: 8, 页码: 477-483
Authors:
G. P. Zhang
;
R. Schwaiger
;
C. A. Volkert
;
O. Kraft
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View/Download:10/0
  |  
Submit date:2012/04/14
Cycle Fatigue
Copper-films
Deformation
Behavior