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Direct measurement of precipitate induced strain in an Al-Zn-Mg-Cu alloy with aberration corrected transmission electron microscopy 期刊论文
MICRON, 2016, 卷号: 90, 页码: 18-22
作者:  Ying, XR;  Du, YX;  Song, M;  Lu, N;  Ye, HQ;  Song, M (reprint author), Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China.
收藏  |  浏览/下载：152/0  |  提交时间：2016/12/28
Aberration Corrected Electron Microscopy  Quantitative Electron Microscopy  Strain Analysis  Precipitates  Aluminum Alloys  
Quantifying the Microstructures of Pure Cu Subjected to Dynamic Plastic Deformation at Cryogenic Temperature 期刊论文
Journal of Materials Science & Technology, 2011, 卷号: 27, 期号: 8, 页码: 673-679
作者:  F. Yan;  H. W. Zhang;  N. R. Tao;  K. Lu
Adobe PDF(1197Kb)  |  收藏  |  浏览/下载：147/0  |  提交时间：2012/04/13
Quantitative Structural Characterization  Cu  Dynamic Plastic  Deformation  Transmission Electron Microscopy  Convergent Beam Electron  Diffraction  Channel Angular Extrusion  Fine Grained Copper  Ultra-high Strains  Mechanical-properties  Thermal-stability  Rate Sensitivity  Stored  Energy  Evolution  Strength  Size  
Expansion of interatomic distances in platinum catalyst nanoparticles 期刊论文
Acta Materialia, 2010, 卷号: 58, 期号: 3, 页码: 836-845
作者:  K. Du;  F. Emst;  M. C. Pelsozy;  J. Barthel;  K. Tillmann
Adobe PDF(645Kb)  |  收藏  |  浏览/下载：161/0  |  提交时间：2012/04/13
Nanoparticles  Catalysts  Atomistic Structure  Quantitative  High-resolution Transmission Electron Microscopy  Spherical-aberration-adjusted Transmission Electron Microscopy  Transmission Electron-micrographs  Pt-co Electrocatalysts  Oxygen  Reduction  Spherical-aberration  Lattice-parameters  Atomic-resolution  Materials Science  Surface-tension  Hrem Images  In-situ  
On the accuracy of maximum entropy reconstruction of high-resolution Z-contrast STEM images 期刊论文
Micron, 2009, 卷号: 40, 期号: 2, 页码: 247-254
作者:  X. H. Sang;  K. Du;  M. J. Zhuo;  H. Q. Ye
Adobe PDF(1414Kb)  |  收藏  |  浏览/下载：131/0  |  提交时间：2012/04/13
Scanning Transmission Electron Microscopy  High-angle Annular Dark-field  Image (Haadf)  Image Processing  Quantitative Electron Microscopy  Transmission Electron-microscopy  Dark-field Images  Grain-boundaries  Adf Stem  Chemistry  Silicon  
Image matching between experimental and simulated high-resolution electron micrographs of sapphire on the [0(1)over-bar10] orientation 期刊论文
JOURNAL OF MICROSCOPY, 2008, 卷号: 232, 期号: 1, 页码: 137-144
作者:  Du, K.;  Ruehle, M.
收藏  |  浏览/下载：89/0  |  提交时间：2021/02/02
high-resolution transmission electron microscopy  image simulation  quantitative electron microscopy  sapphire  
Image matching between experimental and simulated high-resolution electron micrographs of sapphire on the 0(1)over-bar10 orientation 期刊论文
Journal of Microscopy, 2008, 卷号: 232, 期号: 1, 页码: 137-144
作者:  K. Du;  M. Ruhle
Adobe PDF(486Kb)  |  收藏  |  浏览/下载：84/0  |  提交时间：2012/04/13
High-resolution Transmission Electron Microscopy  Image Simulation  Quantitative Electron Microscopy  Sapphire  Crystal Defect Structures  Hrem Images  Interfaces  Hrtem  Retrieval  Alpha-al2o3  Microscopy  Evolution  Package  Films  
Measurement of crystal thickness and orientation from selected-area Fourier transformation of a high-resolution electron hologram 期刊论文
MICRON, 2006, 卷号: 37, 期号: 1, 页码: 67-72
作者:  Du, K;  Wang, YM;  Lichte, H;  Ye, HQ
收藏  |  浏览/下载：86/0  |  提交时间：2021/02/02
electron holography  high-resolution transmission electron microscopy  quantitative electron microscopy  
Measurement of crystal thickness and orientation from selected-area Fourier transformation of a high-resolution electron hologram 期刊论文
MICRON, 2006, 卷号: 37, 期号: 1, 页码: 67-72
作者:  Du, K;  Wang, YM;  Lichte, H;  Ye, HQ
收藏  |  浏览/下载：110/0  |  提交时间：2021/02/02
electron holography  high-resolution transmission electron microscopy  quantitative electron microscopy  
Measurement of crystal thickness and orientation from selected-area Fourier transformation of a high-resolution electron hologram 期刊论文
MICRON, 2006, 卷号: 37, 期号: 1, 页码: 67-72
作者:  Du, K;  Wang, YM;  Lichte, H;  Ye, HQ
收藏  |  浏览/下载：94/0  |  提交时间：2021/02/02
electron holography  high-resolution transmission electron microscopy  quantitative electron microscopy