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Effect of SrRuO3 layer thickness on electrical properties of Pb(Zr0.52Ti0.48)O-3/SrRuO3 superlattices 期刊论文
CERAMICS INTERNATIONAL, 2020, 卷号: 46, 期号: 7, 页码: 9328-9333
Authors:  Lin, Jun Liang;  Wang, Zhan Jie;  Zhao, Xiang;  Zhang, Zhi Dong
Favorite  |  View/Download:61/0  |  Submit date:2021/02/02
Superlattice  PZT/SRO  Pulsed laser deposition  Oxygen vacancy  Electrical properties  
钙钛矿氧化物铁电、铁电薄膜的磁性、输运及铁电特性研究 学位论文
, 北京: 中国科学院金属研究所, 2011
Authors:  王显威
Favorite  |  View/Download:56/0  |  Submit date:2013/04/12
薄膜  脉冲激光沉积  溶胶-凝胶法  铁电性能  磁性能 Films  Pulsed Laser Deposition  Sol-gel Method  Ferroelectric Properties  Magnetic Properties  
Dislocations in charge-ordered Pr(0.5)Ca(0.5)MnO(3) epitaxial thin films prepared by a two-step growth technique 期刊论文
Philosophical Magazine Letters, 2010, 卷号: 90, 期号: 5, 页码: 323-336
Authors:  Y. L. Zhu;  X. Wang;  M. J. Zhuo;  Y. Q. Zhang;  X. L. Ma
Adobe PDF(1192Kb)  |  Favorite  |  View/Download:46/0  |  Submit date:2012/04/13
Dislocations  Transmission Electron Microscopy  Thin Films  Perovskites  Misfit Relaxation Mechanisms  Moire Fringe Contrast  Magnetic-field  Domain Configurations  Strain  Srtio3  Interface  Substrate  Identification  Accommodation  
Microstructural evolution of PbZr(x)Ti(1-x)O(3)/PbZr(y)Ti(1-y)O(3) (n) epitaxial multilayers (x/y=0.2/0.4, 0.4/0.6) - dependence on layer thickness 期刊论文
Philosophical Magazine, 2010, 卷号: 90, 期号: 10, 页码: 1359-1372
Authors:  Y. L. Zhu;  S. J. Zheng;  X. L. Ma;  L. Feigl;  M. Alexe;  D. Hesse;  I. Vrejoiu
Adobe PDF(1803Kb)  |  Favorite  |  View/Download:49/0  |  Submit date:2012/04/13
Ferroelectrics  Transmission Electron Microscopy  Microstructure  Ferroelectric Thin-films  Misfit Relaxation Mechanisms  Domain  Configurations  Heterostructures  Polarization  
钙钛矿型氧化物结构与缺陷的透射电子显微学研究 学位论文
, 金属研究所: 中国科学院金属研究所, 2009
Authors:  郑士建
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透射电子显微术  钙钛矿型氧化物  显微结构  缺陷  
Impact of high interface density on ferroelectric and structural properties of PbZr(0.2)Ti(0.8)O(3)/PbZr(0.4)Ti(0.6)O(3) epitaxial multilayers 期刊论文
Journal of Physics D-Applied Physics, 2009, 卷号: 42, 期号: 8
Authors:  L. Feigl;  S. J. Zheng;  B. I. Birajdar;  B. J. Rodriguez;  Y. L. Zhu;  M. Alexe;  D. Hesse
Adobe PDF(1501Kb)  |  Favorite  |  View/Download:41/0  |  Submit date:2012/04/13
Thin-films  Dislocations  Layer