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Atomic-scale investigation of interface structures in polysynthetically twinned TiAl single crystals 期刊论文
INTERMETALLICS, 2024, 卷号: 164, 页码: 8
作者:  He, Neng;  Cheng, Yongxin;  Yuan, Tian;  He, Lianlong;  Chen, Chunlin;  Qi, Zhixiang;  Chen, Yang;  Chen, Guang;  Ye, Hengqiang
收藏  |  浏览/下载：10/0  |  提交时间：2024/01/07
Polysynthetically twinned TiAl crystals  Interface structures  Steps  Transformation  High-resolution scanning transmission electron microscopy  
Deposition of highly adhesive nanocrystalline diamond films on Ti substrates via diamond/SiC composite interlayers 期刊论文
DIAMOND AND RELATED MATERIALS, 2020, 卷号: 108, 页码: 10
作者:  Yang, Bing;  Li, Haining;  Yu, Biao;  Huang, Nan;  Liu, Lusheng;  Jiang, Xin
收藏  |  浏览/下载：172/0  |  提交时间：2021/02/02
Diamond film  Chemical vapor deposition  Microstructure  Film adhesion  High resolution transmission electron microscopy  
Atomically resolved precipitates/matrix interfaces in KTaO3 crystals 期刊论文
PHILOSOPHICAL MAGAZINE, 2016, 卷号: 96, 期号: 5, 页码: 486-497
作者:  Xu, Y. B.;  Tang, Y. L.;  Liu, Y.;  Ma, X. L.;  Zhu, Y. L.;  ylzhu@imr.ac.cn
收藏  |  浏览/下载：118/0  |  提交时间：2016/04/21
High Resolution (Scanning) Transmission Electron Microscopy  Precipitate  Interface Structures  Orientation Relationships  Ktao3  
Misfit dislocations of anisotropic magnetoresistant Nd0.45Sr0.55MnO3 thin films grown on SrTiO3 (110) substrates 期刊论文
Acta Materialia, 2012, 卷号: 60, 期号: 17, 页码: 5975-5983
作者:  Y. L. Tang;  Y. L. Zhu;  H. Meng;  Y. Q. Zhang;  X. L. Ma
收藏  |  浏览/下载：118/0  |  提交时间：2013/02/05
High Resolution (Scanning) Transmission Electron Microscopy  Misfit  Dislocations  Perovskite Oxides  Misfit Relaxation  Perovskite Films  Nd1-xsrxmno3  Transition  Evolution  
Structural and microstructural analyses of crystalline Er2O3 high-k films grown on Si (001) by laser molecular beam epitaxy 期刊论文
ACTA MATERIALIA, 2011, 卷号: 59, 期号: 4, 页码: 1644-1650
作者:  Wang, X.;  Zhu, Y. L.;  He, M.;  Lu, H. B.;  Ma, X. L.
收藏  |  浏览/下载：114/0  |  提交时间：2021/02/02
Thin films  High-resolution electron microscopy  Energy-filtered transmission microscopy  Interface  Dielectrics  
Structural and microstructural analyses of crystalline Er(2)O(3) high-k films grown on Si (001) by laser molecular beam epitaxy 期刊论文
Acta Materialia, 2011, 卷号: 59, 期号: 4, 页码: 1644-1650
作者:  X. Wang;  Y. L. Zhu;  M. He;  H. B. Lu;  X. L. Ma
Adobe PDF(1143Kb)  |  收藏  |  浏览/下载：120/0  |  提交时间：2012/04/13
Thin Films  High-resolution Electron Microscopy  Energy-filtered  Transmission Microscopy  Interface  Dielectrics  Thin-films  Electrical-properties  Oxide-films  Silicon  Si(001)  Dielectrics  Interface  
Expansion of interatomic distances in platinum catalyst nanoparticles 期刊论文
Acta Materialia, 2010, 卷号: 58, 期号: 3, 页码: 836-845
作者:  K. Du;  F. Emst;  M. C. Pelsozy;  J. Barthel;  K. Tillmann
Adobe PDF(645Kb)  |  收藏  |  浏览/下载：163/0  |  提交时间：2012/04/13
Nanoparticles  Catalysts  Atomistic Structure  Quantitative  High-resolution Transmission Electron Microscopy  Spherical-aberration-adjusted Transmission Electron Microscopy  Transmission Electron-micrographs  Pt-co Electrocatalysts  Oxygen  Reduction  Spherical-aberration  Lattice-parameters  Atomic-resolution  Materials Science  Surface-tension  Hrem Images  In-situ  
Microstructure Investigation on the Triple Junction with an Adjoining Twin Boundary in Nanocrystalline Palladium 期刊论文
Journal of Materials Science & Technology, 2010, 卷号: 26, 期号: 11, 页码: 1047-1050
作者:  Y. C. Wang;  Z. X. Su;  D. H. Ping
Adobe PDF(207Kb)  |  收藏  |  浏览/下载：127/0  |  提交时间：2012/04/13
Triple Junction  Grain Boundary  Molecular Statics  High-resolution  Transmission Electron Microscopy (Hrtem)  High-purity Nickel  Grain-boundary  Corrosion  Joints  Hrem  
An ordered structure of Cu(3)Sn in Cu-Sn alloy investigated by transmission electron microscopy 期刊论文
Journal of Alloys and Compounds, 2009, 卷号: 469, 期号: 1-2, 页码: 129-136
作者:  M. Sang;  K. Du;  H. Q. Ye
Adobe PDF(1394Kb)  |  收藏  |  浏览/下载：107/0  |  提交时间：2012/04/13
Intermetallics  Crystal Structure  Cu(3)Sn  Transmission Electron  Microscopy  Pb-free Solders  Interfacial Reactions  High-resolution  Tin-lead  Intermetallics  Copper  Contrast  Nanoindentation  Interconnects  Kinetics  
Image matching between experimental and simulated high-resolution electron micrographs of sapphire on the [0(1)over-bar10] orientation 期刊论文
JOURNAL OF MICROSCOPY, 2008, 卷号: 232, 期号: 1, 页码: 137-144
作者:  Du, K.;  Ruehle, M.
收藏  |  浏览/下载：90/0  |  提交时间：2021/02/02
high-resolution transmission electron microscopy  image simulation  quantitative electron microscopy  sapphire