IMR OpenIR

浏览/检索结果: 共10条,第1-10条 帮助

已选(0)清除 条数/页:   排序方式:
Interfacial microstructure and mechanical properties of SnBi/Cu joints by alloying Cu substrate 期刊论文
Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing, 2012, 卷号: 532, 页码: 167-177
作者:  H. F. Zou;  Q. K. Zhang;  Z. F. Zhang
收藏  |  浏览/下载:118/0  |  提交时间:2013/02/05
Sn-bi Solder  Void  Cu3sn  Bi Segregation  Interfacial Embrittlement  Cu  Alloys  Solder Interconnect  Grain-boundaries  Single-crystal  Bismuth  Embrittlement  Segregation  Copper  Strength  
Transition of Bi embrittlement of SnBi/Cu joint couples with reflow temperature 期刊论文
Journal of Materials Research, Journal of Materials Research, 2011, 2011, 卷号: 26, 26, 期号: 3, 页码: 449-454, 449-454
作者:  H. F. Zou;  Q. K. Zhang;  Z. F. Zhang
Adobe PDF(440Kb)  |  收藏  |  浏览/下载:95/0  |  提交时间:2012/04/13
Solder Joints  Solder Joints  Interfacial Embrittlement  Interfacial Embrittlement  Single-crystal  Single-crystal  Interconnect  Interconnect  Segregation  Segregation  Tensile  Tensile  Bismuth  Bismuth  
Influences of Substrate Alloying and Reflow Temperature on Bi Segregation Behaviors at Sn-Bi/Cu Interface 期刊论文
Journal of Electronic Materials, 2011, 卷号: 40, 期号: 11, 页码: 2320-2328
作者:  Q. K. Zhang;  H. F. Zou;  Z. F. Zhang
Adobe PDF(2314Kb)  |  收藏  |  浏览/下载:97/0  |  提交时间:2012/04/13
Sn-bi Solder  Bi Segregation  Interfacial Embrittlement  Substrate  Alloying  Reflow Temperature  Tensile Strength  Lead-free Solders  Joints  Microstructure  Embrittlement  Interconnect  Bismuth  Ag  
First-principles Investigation of Bi Segregation at the Solder Interface of Cu/Cu3Sn(010) 期刊论文
JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY, 2010, 卷号: 26, 期号: 12, 页码: 1057-1062
作者:  Pang, X. Y.;  Liu, Z. Q.;  Wang, S. Q.;  Shang, J. K.
收藏  |  浏览/下载:101/0  |  提交时间:2021/02/02
First-principles calculation  Segregation  Bismuth  Interface  SnBi solder  
Improving tensile and fatigue properties of Sn-58Bi/Cu solder joints through alloying substrate 期刊论文
Journal of Materials Research, 2010, 卷号: 25, 期号: 2, 页码: 303-314
作者:  Q. K. Zhang;  H. F. Zou;  Z. F. Zhang
Adobe PDF(2455Kb)  |  收藏  |  浏览/下载:124/0  |  提交时间:2012/04/13
Interfacial Embrittlement  Mechanical-properties  Grain-boundaries  Sn-3.5ag Solders  Bismuth Solder  Copper  Segregation  Metallization  Interconnect  Strength  
First-principles Investigation of Bi Segregation at the Solder Interface of Cu/Cu(3)Sn(010) 期刊论文
Journal of Materials Science & Technology, 2010, 卷号: 26, 期号: 12, 页码: 1057-1062
作者:  X. Y. Pang;  Z. Q. Liu;  S. Q. Wang;  J. K. Shang
Adobe PDF(1171Kb)  |  收藏  |  浏览/下载:85/0  |  提交时间:2012/04/13
First-principles Calculation  Segregation  Bismuth  Interface  Snbi  Solder  Reactive Interface  Cu3sn  Cu  Growth  Principles  Fracture  Crystal  Bismuth  Joints  Copper  
Weakening of the Cu/Cu(3)Sn(100) Interface by Bi Impurities 期刊论文
Journal of Electronic Materials, 2010, 卷号: 39, 期号: 8, 页码: 1277-1282
作者:  X. Y. Pang;  P. J. Shang;  S. Q. Wang;  Z. Q. Liu;  J. K. Shang
Adobe PDF(474Kb)  |  收藏  |  浏览/下载:111/0  |  提交时间:2012/04/13
Dft  Bismuth  Impurity  Interface  Bonding  Solder Interconnect  Molecular-dynamics  Bismuth Solder  Embrittlement  Joints  Copper  Cu3sn  Pseudopotentials  Segregation  Fracture  
Inhibition of interfacial embrittlement at SnBi/Cu single crystal by electrodeposited Ag film 期刊论文
Journal of Materials Research, 2008, 卷号: 23, 期号: 1, 页码: 78-82
作者:  Q. S. Zhu;  Z. F. Zhang;  Z. G. Wang;  J. K. Shang
Adobe PDF(501Kb)  |  收藏  |  浏览/下载:68/0  |  提交时间:2012/04/13
Copper Grain-boundaries  Solder Joints  Bismuth Segregation  Cu  Interconnect  Growth  
Microstructural evolution and cracking of Pb-free ball grid array assemblies under thermal cycling 期刊论文
Journal of Materials Science & Technology, Journal of Materials Science & Technology, Journal of Materials Science & Technology, 2007, 2007, 2007, 卷号: 23, 23, 23, 期号: 1, 页码: 85-91, 85-91, 85-91
作者:  W. Wang;  Z. G. Wang;  A. P. Xian;  J. K. Shang
收藏  |  浏览/下载:105/0  |  提交时间:2012/04/13
Cbga  Cbga  Cbga  Thermal Cycling  Thermal Cycling  Thermal Cycling  Fem  Fem  Fem  Assembly  Assembly  Assembly  Cracking  Cracking  Cracking  Solder Joint Reliability  Solder Joint Reliability  Solder Joint Reliability  Level Reliability  Level Reliability  Level Reliability  Flex-substrate  Flex-substrate  Flex-substrate  Interconnect  Interconnect  Interconnect  Snagcu  Snagcu  Snagcu  Bga  Bga  Bga  Segregation  Segregation  Segregation  Packages  Packages  Packages  Behavior  Behavior  Behavior  Bismuth  Bismuth  Bismuth  
Investigation on aging-induced softening of eutectic microstructure in SnBi/Cu interconnect by nanoindentation 期刊论文
Journal of Materials Science & Technology, Journal of Materials Science & Technology, 2006, 2006, 卷号: 22, 22, 期号: 1, 页码: 130-134, 130-134
作者:  C. Z. Liu;  J. Chen;  P. L. Liu;  J. K. Shang
收藏  |  浏览/下载:107/0  |  提交时间:2012/04/13
Solder  Solder  Interconnect  Interconnect  Nanoindentation  Nanoindentation  Creep  Creep  Deformation  Deformation  Lead-free Solders  Lead-free Solders  Sn-ag  Sn-ag  Creep  Creep  Temperature  Temperature  Tin  Tin  Pb  Pb  Segregation  Segregation  Behavior  Behavior  Fatigue  Fatigue  Bismuth  Bismuth