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Interfacial microstructure and mechanical properties of SnBi/Cu joints by alloying Cu substrate 期刊论文
Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing, 2012, 卷号: 532, 页码: 167-177
作者:  H. F. Zou;  Q. K. Zhang;  Z. F. Zhang
收藏  |  浏览/下载:118/0  |  提交时间:2013/02/05
Sn-bi Solder  Void  Cu3sn  Bi Segregation  Interfacial Embrittlement  Cu  Alloys  Solder Interconnect  Grain-boundaries  Single-crystal  Bismuth  Embrittlement  Segregation  Copper  Strength  
Bismuth segregation enhances intermetallic compound growth in SnBi/Cu microelectronic interconnect 期刊论文
Journal of Alloys and Compounds, Journal of Alloys and Compounds, 2011, 2011, 卷号: 509, 509, 期号: 5, 页码: 1785-1789, 1785-1789
作者:  T. Y. Kang;  Y. Y. Xiu;  C. Z. Liu;  L. Hui;  J. J. Wang;  W. P. Tong
Adobe PDF(743Kb)  |  收藏  |  浏览/下载:101/0  |  提交时间:2012/04/13
Bi Segregation  Bi Segregation  Interconnect  Interconnect  Kinetics  Kinetics  Intermetallic Compound Growth  Intermetallic Compound Growth  Lead-free Solders  Lead-free Solders  Cu  Cu  
Inhibition of Electromigration in Eutectic SnBi Solder Interconnect by Plastic Prestraining 期刊论文
Journal of Materials Science & Technology, 2011, 卷号: 27, 期号: 11, 页码: 1072-1076
作者:  X. F. Zhang;  H. Y. Liu;  J. D. Guo;  J. K. Shang
Adobe PDF(850Kb)  |  收藏  |  浏览/下载:167/0  |  提交时间:2012/04/13
Electromigration  Interfacial Segregation  Prestrain  Dislocation  Vacancy  Electric-current  Segregation  Bi  
Influences of Substrate Alloying and Reflow Temperature on Bi Segregation Behaviors at Sn-Bi/Cu Interface 期刊论文
Journal of Electronic Materials, 2011, 卷号: 40, 期号: 11, 页码: 2320-2328
作者:  Q. K. Zhang;  H. F. Zou;  Z. F. Zhang
Adobe PDF(2314Kb)  |  收藏  |  浏览/下载:97/0  |  提交时间:2012/04/13
Sn-bi Solder  Bi Segregation  Interfacial Embrittlement  Substrate  Alloying  Reflow Temperature  Tensile Strength  Lead-free Solders  Joints  Microstructure  Embrittlement  Interconnect  Bismuth  Ag  
Thermal Stability and Tensile Properties of Electrodeposited Cu-Bi Alloy 期刊论文
Journal of Materials Engineering and Performance, 2011, 卷号: 20, 期号: 3, 页码: 481-486
作者:  X. H. Chen;  J. J. Mao
Adobe PDF(606Kb)  |  收藏  |  浏览/下载:80/0  |  提交时间:2012/04/13
Grain Growth  Nanocrystalline Cu-bi  Segregation  Strength  Thermal  Stability  Nanocrystalline Copper  Segregation  Ni  
Eliminating interfacial segregation and embrittlement of bismuth in SnBi/Cu joint by alloying Cu substrate 期刊论文
Scripta Materialia, 2009, 卷号: 61, 期号: 3, 页码: 308-311
作者:  H. F. Zou;  Q. K. Zhang;  Z. F. Zhang
Adobe PDF(352Kb)  |  收藏  |  浏览/下载:70/0  |  提交时间:2012/04/13
Bi Interfacial Segregation  Embrittlement  Pb-free Solder  Interfacial  Strength  Soldering  Copper Grain-boundaries  Fracture  Boron  Chemistry  Ni3al  
Bi-induced voids at the Cu3Sn/Cu interface in eutectic SnBi/Cu solder joints 期刊论文
Scripta Materialia, 2008, 卷号: 58, 期号: 5, 页码: 409-412
作者:  P. J. Shang;  Z. Q. Liu;  D. X. Li;  J. K. Shang
Adobe PDF(556Kb)  |  收藏  |  浏览/下载:75/0  |  提交时间:2012/04/13
Eutectic Snbi Alloy  Soldering  Interface  Segregation  Transmission  Electron Microscopy (Tem)  Lead-free Solders  Sn-bi  Segregation  Cu  Reliability  Bismuth