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Focused ion beam preparation of microbeams forin situmechanical analysis of electroplated nanotwinned copper with probe type indenters 期刊论文
JOURNAL OF MICROSCOPY, 2020, 卷号: 279, 期号: 3, 页码: 212-216
作者:  Robertson, Stuart;  Doak, Scott;  Sun, Fu-Long;  Liu, Zhi-Quan;  Liu, Changqing;  Zhou, Zhaoxia
收藏  |  浏览/下载：126/0  |  提交时间：2021/02/02
Chunk lift-out  focused ion beam  in situ  micromechanical testing  nanotwinned copper  P-FIB  
Crack propagation of single crystal beta-Sn during in situ TEM straining 期刊论文
Journal of Electron Microscopy, 2010, 卷号: 59, 页码: S61-S66
作者:  P. J. Shang;  Z. Q. Liu;  D. X. Li;  J. K. Shang
收藏  |  浏览/下载：80/0  |  提交时间：2012/04/13
In Situ Tem  Straining  Single Crystal Sn  Slip System  Self-diffusion  Crack Propagation  Free Solder Alloys  Lead-free Solders  Thermal Fatigue  Behavior  Creep  Tin  Pb  Joints  Ag  Deformation  
Image matching between experimental and simulated high-resolution electron micrographs of sapphire on the [0(1)over-bar10] orientation 期刊论文
JOURNAL OF MICROSCOPY, 2008, 卷号: 232, 期号: 1, 页码: 137-144
作者:  Du, K.;  Ruehle, M.
收藏  |  浏览/下载：90/0  |  提交时间：2021/02/02
high-resolution transmission electron microscopy  image simulation  quantitative electron microscopy  sapphire  
Image matching between experimental and simulated high-resolution electron micrographs of sapphire on the 0(1)over-bar10 orientation 期刊论文
Journal of Microscopy, 2008, 卷号: 232, 期号: 1, 页码: 137-144
作者:  K. Du;  M. Ruhle
Adobe PDF(486Kb)  |  收藏  |  浏览/下载：84/0  |  提交时间：2012/04/13
High-resolution Transmission Electron Microscopy  Image Simulation  Quantitative Electron Microscopy  Sapphire  Crystal Defect Structures  Hrem Images  Interfaces  Hrtem  Retrieval  Alpha-al2o3  Microscopy  Evolution  Package  Films  
Electron microscopy study of different stages of oxidation of Ti-47Al-2Nb-2Cr-0.15B and Ti-45Al-15Nb at 900 degrees C 期刊论文
Journal of Microscopy, 2008, 卷号: 231, 期号: 1, 页码: 124-133
作者:  W. Lu;  C. Chen;  L. He;  F. Wang
Adobe PDF(1192Kb)  |  收藏  |  浏览/下载：120/0  |  提交时间：2012/04/13
Nb Additional Tial  Oxidation  Scanning Transmission Electron  Microscopy  x Phase  Gamma-titanium Aluminide  Tial-based Alloys  Behavior  Phase  Deformation  Nitrogen  Layer  Air  Nb  
Characterization of the microstructure in CMR materials by HREM 期刊论文
Journal of Electron Microscopy, 2002, 卷号: 51, 页码: S271-S278
作者:  D. X. Li;  M. G. Wang;  H. Q. Ye
收藏  |  浏览/下载：76/0  |  提交时间：2012/04/14
Hrem  Cmr Materials  Defect  Microdomain  Strain  Interface  Pulsed-laser Deposition  Thin-films  Giant Magnetoresistance  Superlattices  Multilayers  Resistivity  Oxide  
High-resolution electron microscope observation of interface microstructure of a cast Al-Mg-Si-Bi-Pb(6262)/Al2O3p composite 期刊论文
Journal of Microscopy-Oxford, 2001, 卷号: 201, 页码: 144-152
作者:  Z. Zhou;  Z. Fan;  H. X. Peng;  D. X. Li
收藏  |  浏览/下载：106/0  |  提交时间：2012/04/14
Al-mg-si-bi-pb  Alpha Alumina  Beta Alumina  Composite  Hrem  Interface  Metal-matrix Composites  Aluminum-magnesium Alloys  Piston Alloy  Fiber  Fabrication  Particulate  Spinel  Al2o3  Infiltration  Preforms  
Plan-view imaging of oxygen-induced reconstruction on Ag(110) surface. II. Effect of high-energy electron thinning 期刊论文
Journal of Electron Microscopy, 2000, 卷号: 49, 期号: 1, 页码: 173-177
作者:  S. Y. Li;  J. Zhu;  H. Q. Ye
收藏  |  浏览/下载：80/0  |  提交时间：2012/04/14
Transmission Electron Microscopy  Plan-view Imaging Of Surfaces  Sample  Preparation  Electron-solid Interaction  Au(001) Surface  Uhv Microscopy  Si(111)-7x7  Diffraction  Cu(110)  Film  
Plan-view imaging of oxygen-induced reconstruction on Ag(110) surface. I. The possibility of imaging surface oxygen 期刊论文
Journal of Electron Microscopy, 2000, 卷号: 49, 期号: 1, 页码: 163-172
作者:  S. Y. Li;  R. S. Li;  R. N. Guan;  H. Q. Ye;  J. Zhu
收藏  |  浏览/下载：81/0  |  提交时间：2012/04/14
Plan-view Imaging Of Surfaces  Silver  Surface Reconstruction  High-resolution Electron Microscopy  Computer Simulation  Transmission Electron-diffraction  Copper Oxidation  Initial-stage  Kinematical Approximation  Ethylene Epoxidation  Subsurface Oxygen  Au(001) Surface  o Chains  Microscopy  Adsorption  
HREM observation and compositional study of microstructure and phase transformation in TiAl-based and Cu-Al-Ni alloys 期刊论文
Journal of Electron Microscopy, 1999, 卷号: 48, 页码: 1099-1106
作者:  H. Q. Ye;  L. L. He;  R. Yu;  H. Y. Peng
收藏  |  浏览/下载：78/0  |  提交时间：2012/04/14
Synthetic Analysis On a Nanometer/an Atomic Scale  Characterization Of  Microstructure  Tial Intermetallics  Cu-al-ni Shape-memory Alloy  Shape-memory Alloys  Ti2al Phase