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Insight into the effect of reorganized chemical short-range orders at Ga-based alloys/Cu interfaces on the nucleation and growth of CuGa2 crystals
期刊论文
MATERIALS LETTERS, 2022, 卷号: 307, 页码: 4
作者:
Gao, Zhaoqing
;
Chen, Yinbo
;
Wang, Chen
;
Yao, Kai
;
Chai, Zhenbang
;
Ma, Haitao
;
Wang, Yunpeng
;
Huang, Mingliang
收藏
  |  
浏览/下载:174/0
  |  
提交时间:2021/12/09
Crystal growth
Electronic materials
Intermetallic alloys and compounds
Ga-based alloys
Chemical short-range order
Inter-diffusion Based Analytical Model for Growth Kinetics of IMC Layers at Roll Bonded Cu/Al Interface During Annealing Process
期刊论文
METALS AND MATERIALS INTERNATIONAL, 2020, 卷号: 26, 期号: 3, 页码: 333-345
作者:
Hua, Fu-an
;
Song, Hong-wu
;
Sun, Tao
;
Li, Jian-ping
收藏
  |  
浏览/下载:128/0
  |  
提交时间:2021/02/02
Bimetal
Cold roll bonding
Intermetallic compound
Growth kinetics
Inter-diffusion
The interfacial reaction between In-48Sn solder and polycrystalline Cu substrate during solid state aging
期刊论文
JOURNAL OF ALLOYS AND COMPOUNDS, 2018, 卷号: 740, 页码: 500-509
作者:
Tian, FF
;
Li, CF
;
Zhou, M
;
Liu, ZQ
;
Liu, ZQ (reprint author), Chinese Acad Sci, Inst Met Res, Shenyang 110016, Liaoning, Peoples R China.
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浏览/下载:132/0
  |  
提交时间:2018/06/05
Heterogeneous Binary-systems
Chemical-compound Layers
2 Elementary Substances
Eutectic Snin Solder
Intermetallic Compounds
Phase Identification
Reaction-diffusion
Growth-kinetics
Joint
Transformations
The diffusion barrier effect of Fe-Ni UBM as compared to the commercial Cu UBM during high temperature storage
期刊论文
JOURNAL OF ALLOYS AND COMPOUNDS, 2018, 卷号: 739, 页码: 632-642
作者:
Gao, LY
;
Li, CF
;
Wan, P
;
Zhang, H
;
Liu, ZQ
;
Liu, ZQ (reprint author), Chinese Acad Sci, Inst Met Res, Shenyang 110016, Liaoning, Peoples R China.
;
Liu, ZQ (reprint author), Osaka Univ, Inst Sci & Ind Res, Osaka 5670047, Japan.
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  |  
浏览/下载:138/0
  |  
提交时间:2018/06/05
Lead-free Solders
Interfacial Reactions
Sn-ag
Intermetallic Compounds
Rich Solders
Joints
Growth
Reliability
Substrate
Strength
Phase transformation between Cu(In,Sn)(2) and Cu-2(In,Sn) compounds formed on single crystalline Cu substrate during solid state aging
期刊论文
Journal of Applied Physics, 2014, 卷号: 115, 期号: 4
作者:
F. F. Tian
;
Z. Q. Liu
;
J. D. Guo
收藏
  |  
浏览/下载:116/0
  |  
提交时间:2014/04/18
Heterogeneous Binary-systems
2 Elementary Substances
Intermetallic
Compounds
Reaction-diffusion
Growth
Layers
Interface
Solders
Joints
Cu3sn
Precise Cr-marker investigation on the reactive interface in the eutectic SnIn solder joint
期刊论文
Materials Letters, 2014, 卷号: 121, 页码: 185-187
作者:
F. F. Tian
;
P. J. Shang
;
Z. Q. Liu
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  |  
浏览/下载:196/0
  |  
提交时间:2014/07/03
Interfaces
Intermetallic Alloys And Compounds
Diffusion
Kirkendall
Void
Snin Solder
Cu Substrate
Growth-kinetics
Snagcu Solder
Diffusion
Compound
Identification
Ni
Effect of doping Al on the liquid oxidation of Sn-Bi-Zn solder
期刊论文
Journal of Materials Science-Materials in Electronics, 2014, 卷号: 25, 期号: 5, 页码: 2297-2304
作者:
X. J. Wang
;
Q. S. Zhu
;
B. Liu
;
N. Liu
;
F. J. Wang
收藏
  |  
浏览/下载:102/0
  |  
提交时间:2014/07/03
Lead-free Solder
Intermetallic Compound Growth
Corrosion Behavior
Mechanical-properties
Cu Substrate
Alloy
Microstructure
Reduction
Aluminum
Vacuum
Effect of Fe Content on the Interfacial Reliability of SnAgCu/Fe-Ni Solder Joints
期刊论文
Journal of Materials Science & Technology, 2014, 卷号: 30, 期号: 9, 页码: 928-933
作者:
H. Zhang
;
Q. S. Zhu
;
Z. Q. Liu
;
L. Zhang
;
H. Y. Guo
;
C. M. Lai
收藏
  |  
浏览/下载:103/0
  |  
提交时间:2015/01/14
Fe-ni Alloy
Under Bump Metallization (Ubm)
Intermetallic Compound
(Imc)
Reliability
High Temperature Storage
Temperature Cycling
Lead-free Solders
Intermetallic Compounds
Growth-kinetics
Cu
Metallization
Ag
Strength
Ball
Ubm
Effects of Y2O3 Nanoparticles on Growth Behaviors of Cu6Sn5 Grains in Soldering Reaction
期刊论文
Journal of Electronic Materials, 2013, 卷号: 42, 期号: 12, 页码: 3552-3558
作者:
L. M. Yang
;
Z. F. Zhang
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  |  
浏览/下载:111/0
  |  
提交时间:2013/12/24
Lead-free Solder
Intermetallic Compounds
Interfacial Reaction
Grain
Growth
Sn-ag-cu
Shear-strength
Mechanical-properties
Rare-earth
Bga Joints
Alloy
Electromigration
Reliability
Dependence of electromigration damage on Sn grain orientation in Sn-Ag-Cu solder joints
期刊论文
Journal of Applied Physics, 2013, 卷号: 114, 期号: 15
作者:
J. Q. Chen
;
J. D. Guo
;
K. L. Liu
;
J. K. Shang
收藏
  |  
浏览/下载:94/0
  |  
提交时间:2013/12/24
Intermetallic Compound Formation
Diffusion
Tin
Interconnect
Growth
Metals
Gold