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Electrodeposition and growth mechanism of preferentially orientated nanotwinned Cu on silicon wafer substrate 期刊论文
JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY, 2018, 卷号: 34, 期号: 10, 页码: 1885-1890
作者:  Sun FuLong;  Gao LiYin;  Liu ZhiQuan;  Zhang Hao;  Sugahara Tohru;  Nagao Shijo;  Suganuma Katsuaki
收藏  |  浏览/下载:146/0  |  提交时间:2021/02/02
NI SOLDER JOINTS  NANO-SCALE TWINS  INTERFACIAL RELIABILITY  FE-NI  COPPER  METALS  DEFORMATION  STRENGTH  DEPENDENCE  BOUNDARIES  Electrodeposition  Nanotwinned Cu  Growth mechanism  Acid adsorption  
Corrosion behavior of Sn-3.0Ag-0.5Cu solder under high-temperature and high-humidity condition 期刊论文
Journal of Materials Science-Materials in Electronics, 2014, 卷号: 25, 期号: 3, 页码: 1228-1236
作者:  M. N. Wang;  J. Q. Wang;  W. Ke
收藏  |  浏览/下载:116/0  |  提交时间:2014/04/18
Lead-free Solders  3.5-percent Nacl Solution  Electrochemical Corrosion  Ga Solder  Reliability  Surface  Alloys  Joints  Tin  Sn  
Effects of Y2O3 Nanoparticles on Growth Behaviors of Cu6Sn5 Grains in Soldering Reaction 期刊论文
Journal of Electronic Materials, 2013, 卷号: 42, 期号: 12, 页码: 3552-3558
作者:  L. M. Yang;  Z. F. Zhang
收藏  |  浏览/下载:111/0  |  提交时间:2013/12/24
Lead-free Solder  Intermetallic Compounds  Interfacial Reaction  Grain  Growth  Sn-ag-cu  Shear-strength  Mechanical-properties  Rare-earth  Bga Joints  Alloy  Electromigration  Reliability  
Thermal fatigue behaviors of Sn-4Ag/Cu solder joints at low strain amplitude 期刊论文
Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing, 2013, 卷号: 580, 页码: 374-384
作者:  Q. K. Zhang;  Z. F. Zhang
收藏  |  浏览/下载:108/0  |  提交时间:2013/12/24
Sn-ag/cu Solder Joints  Thermal Fatigue  Strain Localization  Grain  Rotation  Dynamic Recovery  Stress-relaxation Behavior  Eutectic Sn-3.5ag Solder  Lead-free Solders  Pb-free Solders  Sn-ag  Tensile Properties  Shear-strength  Fracture-behavior  Deformation  Creep  
The effects of temperature and humidity on the growth of tin whisker and hillock from Sn5Nd alloy 期刊论文
Journal of Alloys and Compounds, 2013, 卷号: 550, 页码: 231-238
作者:  C. F. Li;  Z. Q. Liu;  J. K. Shang
收藏  |  浏览/下载:119/0  |  提交时间:2013/12/24
Tin Whisker  Hillock  Ndsn3  Oxidation  Growth Mechanism  Lead-free Solder  Electron-microscopy  Nd Addition  Sn-whiskers  Joints  Mechanisms  
Effects of Zn addition on electromigration behavior of Sn-1Ag-0.5Cu solder interconnect 期刊论文
Journal of Materials Science-Materials in Electronics, 2013, 卷号: 24, 期号: 1, 页码: 211-216
作者:  H. Y. Liu;  Q. S. Zhu;  Z. G. Wang;  J. D. Guo;  J. K. Shang
收藏  |  浏览/下载:100/0  |  提交时间:2013/12/24
Intermetallic Compound Formation  Sn-3.8ag-0.7cu Solder  Cu  Microstructure  Joints  
In-situ observation of fracture behavior of Sn-3.0Ag-0.5Cu lead-free solder during three-point bending tests in ESEM 期刊论文
Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing, 2012, 卷号: 558, 页码: 649-655
作者:  M. N. Wang;  J. Q. Wang;  H. Feng;  W. Ke
收藏  |  浏览/下载:112/0  |  提交时间:2013/02/05
Lead-free Solder  Microstructure  Corrosion  Three-point Bending  Fracture  Electrochemical Corrosion Behavior  3.5-percent Nacl Solution  Ga  Solder  Alloys  Sn  Joints  
Surface Morphology of Sn-Rich Solder Interconnects After Electrical Loading 期刊论文
Journal of Electronic Materials, 2012, 卷号: 41, 期号: 4, 页码: 741-747
作者:  Q. S. Zhu;  H. Y. Liu;  Z. G. Wang;  J. K. Shang
收藏  |  浏览/下载:111/0  |  提交时间:2013/02/05
Solder Interconnect  Electromigration  Hillock  Grain Boundary Groove  Joints  Electromigration  Whisker  Copper  Tin  Cu  
Effects of solder dimension on the interfacial shear strength and fracture behaviors of Cu/Sn-3Cu/Cu joints 期刊论文
Scripta Materialia, 2012, 卷号: 67, 期号: 7-8, 页码: 637-640
作者:  L. M. Yang;  Q. K. Zhang;  Z. F. Zhang
收藏  |  浏览/下载:88/0  |  提交时间:2013/02/05
Solder Joint  Interfaces  Intermetallic Compounds  Fracture  Shear  Strength  Lead-free Solder  Brazed Joints  Size  Sn  Microstructure  Deformation  Reliability  Failure  Copper  Cu  
Microstructural Study of Interfacial Reactions Between Liquid Sn and Electroless Fe-Ni Alloys 期刊论文
Journal of Electronic Materials, 2012, 卷号: 41, 期号: 11, 页码: 3161-3168
作者:  H. F. Zhou;  J. D. Guo;  J. K. Shang
收藏  |  浏览/下载:99/0  |  提交时间:2013/02/05
Electroless Fe-ni  Under-bump Metallization  Interfacial Reaction  Lead-free Solders  Wetting Balance  Snagcu Solder  Cu  Joints  Solderability  Growth  Ag