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The interfacial reaction and microstructure of Co/In/Cu sputtering target assembly after soldering
期刊论文
MICROELECTRONICS RELIABILITY, 2020, 卷号: 113, 页码: 6
作者:
Liu, Zhi-Quan
;
Meng, Zhi-Chao
;
Wu, Di
;
Shang, Zhengang
;
He, Xin
;
Xiong, Xiaodong
收藏
  |  
浏览/下载:172/0
  |  
提交时间:2021/02/02
Co sputtering target
Soldering assembly
Interface
IMC
Growth mechanism
Influence of External Interface Normal Stress on the Growth of Cu-Sn IMC During Aging
期刊论文
ACTA METALLURGICA SINICA-ENGLISH LETTERS, 2020, 卷号: 33, 期号: 10, 页码: 9
作者:
Wang, Changchang
;
Chen, Yinbo
;
Liu, Zhi-Quan
收藏
  |  
浏览/下载:120/0
  |  
提交时间:2021/02/02
Cu-Sn IMC
Growth behavior
External stress effect
Isothermal aging
Reliability issues of lead-free solder joints in electronic devices
期刊论文
SCIENCE AND TECHNOLOGY OF ADVANCED MATERIALS, 2019, 卷号: 20, 期号: 1, 页码: 876-901
作者:
Jiang, Nan
;
Zhang, Liang
;
Liu, Zhi-Quan
;
Sun, Lei
;
Long, Wei-Min
;
He, Peng
;
Xiong, Ming-Yue
;
Zhao, Meng
收藏
  |  
浏览/下载:196/0
  |  
提交时间:2021/02/02
Lead-free solder
reliability
IMC
crack
failure
Structure and properties of Sn-Cu lead-free solders in electronics packaging
期刊论文
SCIENCE AND TECHNOLOGY OF ADVANCED MATERIALS, 2019, 卷号: 20, 期号: 1, 页码: 421-444
作者:
Zhao, Meng
;
Zhang, Liang
;
Liu, Zhi-Quan
;
Xiong, Ming-Yue
;
Sun, Lei
收藏
  |  
浏览/下载:293/0
  |  
提交时间:2021/02/02
Sn-Cu
microstructures
IMC
mechanical properties
Microstructural evolution and failure mechanism of 62Sn36Pb2Ag/Cu solder joint during thermal cycling
期刊论文
MICROELECTRONICS RELIABILITY, 2019, 卷号: 99, 页码: 12-18
作者:
Li, Qi-hai
;
Li, Cai-Fu
;
Zhang, Wei
;
Chen, Wei-wei
;
Liu, Zhi-Qua
收藏
  |  
浏览/下载:136/0
  |  
提交时间:2021/02/02
62Sn36Pb2Ag solder joint
Microstructural evolution
Failure analysis
Intermetallic compound (IMC)
Thermal cycling
Microstructural evolution and failure mechanism of 62Sn36Pb2Ag/Cu solder joint during thermal cycling
期刊论文
MICROELECTRONICS RELIABILITY, 2019, 卷号: 99, 页码: 12-18
作者:
Li, Qi-hai
;
Li, Cai-Fu
;
Zhang, Wei
;
Chen, Wei-wei
;
Liu, Zhi-Qua
收藏
  |  
浏览/下载:129/0
  |  
提交时间:2021/02/02
62Sn36Pb2Ag solder joint
Microstructural evolution
Failure analysis
Intermetallic compound (IMC)
Thermal cycling
Growth Behavior of Intermetallic Compounds in Cu/Sn3.0Ag0.5Cu Solder Joints with Different Rates of Cooling
期刊论文
Journal of Electronic Materials, 2015, 卷号: 44, 期号: 1, 页码: 590-596
作者:
L. M.
;
Zhang Yang, Z. F.
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  |  
浏览/下载:136/0
  |  
提交时间:2015/05/08
Intermetallic Compounds (Imc)
Solder Joint
Cooling Rate
Solidification
Adsorption
Ag-cu Solder
Cu6sn5 Grains
In-situ
Sn
Alloy
Nanoparticles
Ag3sn
Microstructure
Technology
Particles
Growth mechanism of duplex structural Cu-2(In,Sn) compound on single crystalline Cu substrate
期刊论文
Journal of Alloys and Compounds, 2014, 卷号: 588, 页码: 662-667
作者:
F. F. Tian
;
Z. Q. Liu
收藏
  |  
浏览/下载:143/0
  |  
提交时间:2014/03/14
48sn52in
Imc
Morphology
Orientation Relationship
Ebsd
Interfacial Reactions
Soldering Reaction
Joint Reliability
Void
Formation
Solid-state
Sn
Cu3sn
Alloy
Creep
Phase identification on the intermetallic compound formed between eutectic SnIn solder and single crystalline Cu substrate
期刊论文
Journal of Alloys and Compounds, 2014, 卷号: 591, 页码: 351-355
作者:
F. F. Tian
;
Z. Q. Liu
;
P. J. Shang
;
J. D. Guo
收藏
  |  
浏览/下载:143/0
  |  
提交时间:2014/04/18
Phase Identification
Interface
Imc
Eutectic Snin Solder
Single
Crystalline Cu
Gamma-angular Correlations
Lead-free Solders
Joint Reliability
Growth-kinetics
System
Equilibria
Mechanisms
Interfaces
Diffusion
Layer
Effect of Fe Content on the Interfacial Reliability of SnAgCu/Fe-Ni Solder Joints
期刊论文
Journal of Materials Science & Technology, 2014, 卷号: 30, 期号: 9, 页码: 928-933
作者:
H. Zhang
;
Q. S. Zhu
;
Z. Q. Liu
;
L. Zhang
;
H. Y. Guo
;
C. M. Lai
收藏
  |  
浏览/下载:103/0
  |  
提交时间:2015/01/14
Fe-ni Alloy
Under Bump Metallization (Ubm)
Intermetallic Compound
(Imc)
Reliability
High Temperature Storage
Temperature Cycling
Lead-free Solders
Intermetallic Compounds
Growth-kinetics
Cu
Metallization
Ag
Strength
Ball
Ubm